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Toolkit for testing CCD cameras. Janusz Użycki Faculty of Physics Warsaw University of Technology. CCD matrix (Charge-Coupled Devices). CCD sensors are produced in full choice
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Toolkit for testing CCD cameras Janusz Użycki Faculty of Physics Warsaw University of Technology
CCD matrix(Charge-Coupled Devices) CCD sensors are produced in full choice of resolution and dimenstions. They areaccessible with diameter biggerthan half inch.It is very important in professionalastronomyapplications. The CCD sensors are low noiseand have high sensivity. selected resolution: 2048x2048 pixels, 15x15m each
How it worksmain idea of readoutfrom CCD sensor making a photo exposure time photons charges vs light empty
How it works horizontal shift of charges
How it works vertical shiftof chargesin a queue
How it works video signal ADC horizontal shift amplifier readout
How it works f3 f2 f1 n SiO2 p cross-section
How it works f3 f2 f1 p n Inserting a charge into the CCD matrix the charge inserting egde barier
How it works Potential well confinement
How it works three phases clock signals
How it works three stagesof chargemovingprocess
Solutions - cold environment (about -10C) - noise and infra-red radiation reduction - statistical methods for analizing „black / dark photos” – finding the best parameters Example: CCD amplifier ADC light readout What is a total gain of the circuit?
Requirements for the toolkitfor testing CCD cameras • designed for PC platform: • Windows XP and 2000 systems • (main platform for electronics) • Linux system possible • It was used ROOT library packageand Microsoft Visual C++.
Requirements – continuation (1) • read images in fits • astronomical format which is used • by our aparature • (there are raw data from the CCD)
Requirements – continuation (2) • eliminate the offset and ‘hot’ pixels • by substraction of two successive images
Requirements – continuation (3) • display pictures • the preview allows to find • main errors instantly • cut egdes for analize to find • the best useful part of view
Requirements – continuation (4) • XY histogram single pixel distribution • it allows to find min/max brightness of view • X and Y profile (sum or average) to find unvisible errors, dark current effect for example
Requirements – continuation (5) • X and Y profile (projection) histograms • divide the image into regions and make single pixel histograms, fit Gauss distribution parameters (mean and sigma values) We can estimate where is a bad region.
Requirements – continuation (6) • plot chart in mean and sigma axis to fit gain line and pitch of one (tangens of angle)Here is an answer for question:What is a total gain of the circuit? • electrons / ADU value = pitch of the line
CCD Toolkitin actionexamples of print-screens main window (management)
CCD Toolkitin action previewwindow (enlargement)
CCD Toolkitin action histograms for XY& profiles
CCD Toolkitin action profiles (projections)
CCD Toolkitin action afterdivision into regions
CCD Toolkitin action exampleof badgain fittingreason: offset sigma mean
Summary • program is still testing and it will be developing and improving • if necessary- there is a lot of work for tuning the best parameters for our new cameras