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FTPC Performance

FTPC Performance. Electronics Evolution Performance & Operational Parameters Summary. Frank Simon, MPI Munich, Germany. FTPC Review, July 19, 2004. Outline. Evolution of Electronics: 2003. There seems to be a more or less constant rate of failures Failed RDO board on East after day 70

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FTPC Performance

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  1. FTPC Performance Electronics Evolution Performance & Operational Parameters Summary Frank Simon, MPI Munich, Germany FTPC Review, July 19, 2004 Outline

  2. Evolution of Electronics: 2003 • There seems to be a more or less constant rate of failures • Failed RDO board on East after day 70 • Several blown fuses due to discharges in pp run

  3. Exchange of Electronics after d+Au run • FEE cards with more than 8 bad pads are exchanged • About 50 cards exchanged • Work takes approx. 2 days per detector • Cards have been repaired at MPI • Problem: Running out of spare chips at some point, but • Usually only one chip bad per FEE • Can chips be re-used?

  4. Electronics in 2004 • Significant changes during the run, especially through the loss of fuses -> Need better protection of the FEEs from discharges • Gain was reduced to limit the risks of further losses Day 15 Day 24 Day 53 Day 67 Day 78 Day 86

  5. Effect of Anode Voltage on Efficiency • Increase by 50 V increases efficiency significantly • Efficiency might be recovered partially at lower gain by tuning hit finding, was done for 2001 Au+Au

  6. Spatial Resolution • Residuals vs anode voltage for d+Au (similar for Au+Au 2004) • Big improvement by fixing grounding problem for d+Au run • Small improvement with voltage increase

  7. Charge • The Max ADC shows the dependence of the gain on the voltage, 50 V increase -> factor 2 in gain

  8. Two-Track Resolution • Results from the AuAu 2001 run

  9. Efficiency from Embedding • High efficiency in d+Au (insensitive areas included in the plot) • Drop of efficiency with multiplicity, tuning of parameters might help d+Au Au+Au 2001

  10. Momentum Resolution • Numbers from the 2001 Au+Au run • Significant improvement for d+Au

  11. Summary • In d+Au run more or less constant loss of electronics, about 50 cards had to be replaced • In 2004 Au+Au several catastrophic events due to discharges, triggered probably by high background rates lead to significant loss of acceptance • Gain reduction as a safety measure • Need additional FEE protection! • Gain reduction affects efficiency and resolution • Detector performance goals (two-track resolution, efficiency) met, some problems remain at highest multiplicity • Simulation & Embedding framework used for corrections

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