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Diamond Sensor Update

Diamond Sensor Update. Jeff Wiseman 7/27/09. Ran tests on resistors and capacitors to check the precision and calibration of the quadtech 2 capacitors 1pf and 3pf, 1 resistor 3 ohm Each test was run from 0-200V and 0-neg 200v at 10V steps with an average of 5 points each

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Diamond Sensor Update

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  1. Diamond Sensor Update Jeff Wiseman 7/27/09

  2. Ran tests on resistors and capacitors to check the precision and calibration of the quadtech 2 capacitors 1pf and 3pf, 1 resistor 3 ohm Each test was run from 0-200V and 0-neg 200v at 10V steps with an average of 5 points each Graphs of both capacitance and resistance for all 3 tests are shown The setup for these tests was using Quadtech component test fixture to take floating point measurements, connecting to both sides of the object being measured and not the ground and the object Quadtech Tests

  3. Test Setup • Object is placed between the leads and then the plunger is depressed until there is good contact made • Tightening screw is tightened to secure the object in place • Leads are touching either both ends of the capacitor or resistor, or both sides of the diamond when testing • Functioned properly when we fixed the calibration procedure by adding a good contact to make a short using a copper block Tightening Screw Leads

  4. Use parallel model for C,R 1 pF Capacitor Tests

  5. 3 pF Capacitor Tests

  6. 3 Ohm Resistor Tests

  7. Analysis • After testing, the capacitors and resistor showed good results, with minimal variations around the expected value • These values were acceptable because they were close to the expect range if any of them were ideal, however minimal leakage along with measurement error is allowed, giving us expected measurements => Next moved on to start testing on the diamond sensor

  8. CVD Diamond CVD DIAMOND SAMPLE 10.13 mm 8.73 mm diam 10.13 mm rough-cut edges 480 μm (thk) Gold Pad Diamond (bulk)

  9. Expected Diamond Values • Capacitance: Generalized as parallel plate capacitor • Expected capacitance = 6.28 pF • C=εA/d • ε= εr * ε0 = 5.7 * 8.85 * 10-12 = 5.0445 F/m • A = π * (.0043625m)2 = 59.7889 μm2 • D = 480 μm

  10. Diamond Testing • Tests were run over consecutive days 7/20/09-7/22/09 • All tests were run from 0-200V and 0-neg 200V with steps of 10V with an average of 5 measurements at each point • Graphs show the capacitance vs. voltage, resistance vs. voltage, histograms of capacitances, and discontinuities at 0V • Diamond was also tested using the same instrument setup as the capacitor and voltage test, with the diamond sitting vertical, the gold pads being attached to the leads

  11. Mean: 5.46 pF RMS: .000104863

  12. Analysis • Measured Capacitance: ~5.464 pF • Measured Resistance : ~ 5.4 Gohms • Histogram shows a distribution that is basically Gaussian, with a standard error of +/- 2.228 x 10-5 • Capacitance was very consistent around 0V with a maximum discontinuity of 1.07fF, less than .1% of our measured value

  13. Plans • Looking into and ordering ceramic chip carriers to help with IV measurement • Work out expected resistance • Continue any other testing that needs to be done

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