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News of the CALICE - ECAL. Sampling calorimeter tungsten-silicon. 1 - Progress report on the E CAL prototype 2 - New informations on the cost of the W-Si ECAL 3 - A proposal for a new design of the detector slab 4 - Conclusion. Progress report on the prototype. Mid-march
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News of the CALICE - ECAL Sampling calorimeter tungsten-silicon 1 -Progress report on the ECAL prototype 2 -New informations on the cost of the W-Si ECAL 3 -A proposal for a new design of the detector slab 4 - Conclusion
Progress report on the prototype Mid-march A first sample of tungsten plates arrives at LLR => metrology The design of the front-end chip is fixed. First batch for test. End-march Production of the final set of masks for the silicon wafers processing Beginning-April Start the production of a sample of 40 tungsten plates corresponding to the first technological test and first stack of prototype April-May Processing of the first 25 silicon wafers (DC coupled) May-September Processing and test of about 100 silicon wafers Final submission of the VFE chip for the prototype
Metrology of the first 3 tungsten plates made at LLR It confirms the good quality of the plates As measured at IHEP and ITEP
Technological prototype – detector slab • Second configuration : using PCB solution + internal Frond End Front End electronics Silicon wafer Cooling system Aluminium (C / W) structure type H Signals output PCB
Physics prototype – detector slab • PCB and Front End electronics details : Silicon wafer PCB Flexible circuit Composite Tungsten max 4.5 mm Front End electronics Possible thickness for Front End electronics in this case : 4.5 mm
Physics prototype – cosmic tests - Measurement surface : 128128 mm - Precision : 0.5 mm 1st X-Y line (scintillating fibers) 1 mm Cross-section Detector slab 2nd X-Y line (scintillating fibers) 4 silicon wafer tested
About the cost of the W-Si ECAL Some interesting distributions (updated recently) Moore's Law for Silicon Microstrip Detectors ~ 2000 m² Silicon Area (m²) 1000 CMS 100 GLAST ATLAS 10 NOMAD DO AMS01 CDF 1 LEP CDF 0.1 DATA From H.F-W. Sadrozinski, UC-Santa Cruz
New elements for the cost of the ECAL Cost<< 2$/cm² WARNING : cost (2010) < 2 $/cm²is for microstrip Processing (Guestimate from H.S.) Moore's Law for Silicon Detectors 50 BUT for ECAL W-Si 4'' Wafer size 6'' ¨Number of masks (x 0.5 ) ¨Industrial Yield (x 2 ) ¨use of 8'' wafers ? cost/area ($/cm²) 10 Used in the TDR At least a factor 2 cheaper is expected ß < 2 $/cm² 2 Blank wafer price 6'' 1 DATA From H.F-W. Sadrozinski, UC-Santa Cruz
Re-calculate the estimation of cost, using the2 €/cm²for the silicon The cost of the ECAL is between 68 (20 layers) to99(40layers) M€ With the HCAL (i.e. version DHCAL) , the total cost of the calorimeter ranges from 129(20 layers) to175(40 layers) MCH (CMS equivalent is 145 MCH) 1 -For the complete set ECAL + HCAL + Muon-CH ( MCH) 2 -The change of the geometry can further reduce the cost (length of barrel, internal radius,...) 18/40% reduction CMS 216 Calice -FLC 132/178
Proposal for a new design of the detector slab Why ? There is a very small available space for the VFE board (0.2x1x2cm³) Number of bonding/cm on the VFE board (about 160/cm) Some risk of pick-up noise (EMC) (coherent noise with32 Mchannels) Number of wires/lines per cm in the flex (from diodes to VFE) Industrial feasibility for these processesseems difficult COST What else ? START from usual electronics industrial processes 1 - Use PCBwith low density readout strip 2 - Keepindustrial yield of the silicon diodes as high as possible 3 - Keep thesmall thicknessof the total 4 - Keep thepad size open(from 0.5 to 1.5 cm) (SD, LD, ...or Rext. TPC)
Point 1Multiplexing inside the alveolus VFE chip inside PCB low densitycooling inside ?? My commentsUP to 200cm PCB low density is quasi-INDUSTRIAL (130 cm is already in the box) Point 2 VFE and Si wafer have independent fabrication process Industrial Yield(VFE is not ``bump bonded'' on the wafer) VFE chip on one side of PCB and diodes on the other My comments - No thermal dissipation through the silicon wafer - Put a silicon wafer on one side and VFE chip on the other side is INDUSTRIAL Point 3 Thin packaging , large area VFE chip Small overall thickness My comments Thickness of the VFE-chip packaging 1mm is INDUSTRIAL Point 4 The pad size depends on the power/channel , cooling system Adaptable pad sizeand duty cycle of the VFE My comments The pad size can be as low as 0.5 cm
Calculation byJ.Badier (LLR) With5mW/c(which not so easy...) 1 -A cooling is NEEDED(at the middle of a module , DT 400°) 2 - It is not so demanding for the thickness Rectangular tube 1mm x 20 mm bar/m D°K
Transverse view - New design of the detector slab - ECAL AC coupling elements if needed Budget (mm) 0.3 Al(sup) 0.1 Glue 1.0 VFE Thermal contact if needed Aluminium 0.3 mm Cooling tube Cooling tube VFE chip 1.1 mm 2-3 cm powerline command line signal out 1.0 mm PCB Pad 0.5 mm Silicon wafer Conductive glue for electrical contact
Advantages and drawbacks Advantages A priori, all processes are uncorrelated (Si wafer , VFE chip , PCB,...) we could expect a good Industrial Yield A priori, all processes are (quasi-) industrial The mounting of the detector slab is a classical job for electronics industrial Probably easier access to VFE board (not so trivial argument) Technically, There are interesting challenges, BUT there are no orders of magnitude to gain Almost feasible today Drawbacks What is the behaviour of a VFE chip when a 400 GeV e.m. Shower goes through ?? Could (and will) be rapidly tested
Conclusions Progress report on the prototype Tungsten, first plates arrived, first sample soon in production Silicon wafers, final masks have been designed VFE chip is in production for the first batch (test) Costing of the calorimeter for FLC The project is in the extrapolation of the Moore'slaw for the cost and area of silicon to be processed Very probably, the processed silicon wafers will be <2$/cm ² Even withW-Si ECAL, there is an important cost reduction when compared to the equivalent in CMS CALICE Collaboration New design of the detector slab A lot of advantages - INDUSTRIAL processes The extrapolation from VFE chip is reasonable The extrapolation for the readout lines is reasonable