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Measurement Report RSI SRI. Dye February 2013. NT-MDT America Inc 3200 Scott Blvd. Santa Clara, CA 95054 Phone: 408-988-8409. Experimental Condition. Instrument SPM device: NTEGRA Spectra Upright, Scanning head (not SNA) Environment Air-pumped optical table, no acoustic closure
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Measurement Report RSI SRI Dye February 2013 NT-MDT America Inc 3200 Scott Blvd. Santa Clara, CA 95054 Phone: 408-988-8409
Experimental Condition • Instrument • SPM device: NTEGRA Spectra Upright, • Scanning head (not SNA) • Environment • Air-pumped optical table, no acoustic closure • Measurement Mode • AFM (scanning-by-sample, capacitance sensors): • RSI • Probes • NSG 03 by NT-MDT • Sample evaluated • Blue Dye sample. Sample courtesy: Yuri Bobrov
RSI Characterization RSI Topography Image. Scan size is 1x1 um. Z range is 4.5 nm
RSI Characterization Topography Stiffness RSI Topography (left). Corresponding Stiffness (right) Image.
RSI Characterization Topography Stiffness RSI Topography (left) and corresponding Stiffness (right) Images after shading.