1 / 16

NeSSI AND ANALYZERS

NeSSI AND ANALYZERS. ISSUES AND DISCUSSION REGARDING THE SAM CONCEPT FROM THE ANALYZER SUPPLIERS PERSPECTIVE. NESSI GENERATION I. LIMITED PASSIVE COMPONENTS LIMITED ACTIVE / SENSOR COMPONENTS VIRTUALLY NO SMART COMPONENTS. COMPONENTS BASED ON SEMICONDUCTOR AVAILABILITY

juan
Download Presentation

NeSSI AND ANALYZERS

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. NeSSI AND ANALYZERS ISSUES AND DISCUSSION REGARDING THE SAM CONCEPT FROM THE ANALYZER SUPPLIERS PERSPECTIVE

  2. NESSI GENERATION I • LIMITED PASSIVE COMPONENTS • LIMITED ACTIVE / SENSOR COMPONENTS • VIRTUALLY NO SMART COMPONENTS

  3. COMPONENTS BASED ON SEMICONDUCTOR AVAILABILITY GENERAL PURPOSE PREMIUM $ PURE GASES LIQUID SERVICE COMPATIBILITY SENSOR I/O GENERALLY LIMITED TO ANALOG HARDWARE WHERE HAZARDOUS AREA CLASS IS APPLICABLE PRESSURE XMITTER TEMPERATURE XMITTER FLOW XMITTER NeSSI GENERATION I

  4. NeSSI GENERATION I • AT-LINE VAPOR SAMPLE VALIDATION SYSTEM • SOLID SUBSTRATE • SEMICON COMPONENTS • INDUSTRIAL SENSORS • ANALOG • LIBERTIES TAKEN - DIV 2

  5. NeSSI GENERATION II • INDUSTRIAL - CENTRIC COMPONENTS NOW AVAILABLE AND NUMBERS GROWING • MODULAR SUBSTRATES • DISCUSSION OF BUS BASED SENSORS • CONCEPTS ON SENSOR INTELLIGENCE BEING DEVELOPED • INTERFACE? HOW? WHERE? WHY? WHEN?

  6. NeSSI GENERATION II • SAM • DEVICENET / SDS / OTHERS • ETHERNET IP • INDUSTRIAL GRADE • HAZARDOUS LOCATION - ZONE/DIVISION I • HEATING • ELECTRO / MECHANICAL DEVICES

  7. NeSSI GENERATION II • HOW? • AT THE GII LEVEL, FLEXIBILITY WILL BE THE KEY • AVAILABLE SENSORS MAY BE MIXED MODE • ANALOG HAZARDOUS LOCATION • ANALOG I.S. • DEVICENET • CAN OPEN

  8. NeSSI GENERATION II • HOW? • THE SAM WILL LIKELY NEED CAPABLE OF INTERFACING MIXED MODE SENSORS INTO ANY CUSTOMER COMMUNICATION PROTOCOL TRANSMITTED TO NUMEROUS HMI DEVICES AND DISTRIBUTED CONTROL SYSTEM PROTOCOLS

  9. NeSSI GENERATION II • WHERE? • LOCAL INTERFACE FOR TROUBLESHOOTING • REMOTE FOR MONITORING AND DATA ARCHIVAL

  10. NeSSI GENERATION II • WHY? • TO MONITOR SHS FUNCTION • TO ARCHIVE SHS OPERATIONAL DATA • TO ADJUST SHS ACTIVE SENSORS IF APPLICABLE

  11. NeSSI GENERATION II • WHY? • MAINTAINABILITY • MAINTENANCE EFFICIENCY • PROVE THE TECHNOLOGY • STUDY COST TO BENEFIT ISSUES

  12. NeSSI GENERATIONS II & III • ANALYZER TYPES • TRANSMITTER / SENSOR • SIMPLE ANALYSIS • HIGHER LEVEL

  13. NeSSI GENERATIONS II & III • ANALYZER INTEGRATION • Most transmitter and simple analyzers do not feature the horsepower to support external SAM issues • Higher level analyzers are manufacturer optimized for their primary goal - providing a solid compositional measurement • This is a market driven definition

  14. NeSSI GENERATIONS II & III • Addition of a flexible sensor interface to the higher level analyzer will mean $$$$ • Sample systems have personalities • Additional Hardware = Additional Space

  15. NeSSI GENERATION II & III • I/O is already on the market • I/O already has a developed base • I/O offers the flexibility on INPUT and OUTPUT requirements for our customers • I/O can meet the requirements for the area in which it is installed • I/O can offer intelligence for active sensors via single loop controllers where needed

  16. NeSSI GENERATION II & III • From the analyzer manufacturers perspective, the market will need to prove the cost to benefit issues regarding internal flexible I/O and control • Reinvent the wheel? • The solution needs to be engineered on the basis of the goal: Data • Future? Control… Intelligence… Reliability!

More Related