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Effect of low-intensity direct current on expression of vascular endothelial growth factor and nitric oxide in diabetic foot ulcers. Mohammad Reza Mohajeri-Tehrani, MD; Faezeh Nasiripoor, MSc; Giti Torkaman, PhD; Mehdi Hedayati, PhD; Zohreh Annabestani, MD; Mohammad Reza Asadi, MSc. Aim
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Effect of low-intensity direct current on expression of vascular endothelial growth factor and nitric oxide in diabetic foot ulcers Mohammad Reza Mohajeri-Tehrani, MD; Faezeh Nasiripoor, MSc; Giti Torkaman, PhD; Mehdi Hedayati, PhD; Zohreh Annabestani, MD; Mohammad Reza Asadi, MSc
Aim • Investigate effect of low-intensity cathodal direct current on release of plasma vascular endothelial growth factor (VEGF) and nitric oxide (NO) in diabetic foot ulceration. • Relevance • Diabetic foot ulceration is a significant complication of diabetes. • Evidence exists that expression of growth factors like VEGF may reduce its occurrence.
Method • Subjects: • 20 type 2 diabetic patients with foot ulceration. • 13 age-matched healthy subjects. • Treatment (random assignment): • Electrical stimulation (ES) (n = 10). • Cathodal direct current 1 h/d, 3 d/wk for 4 wk (12 sessions). • Sham ES (placebo, n = 10). • Measures: • VEGF and NO (blood samples) at 1st and 12th sessions before and after intervention. • Wound surface area and skin temperature at 1st, 6th, and 12th sessions.
Results • VEGF: • Significantly increased in ES compared with sham ES after 1st and 12th sessions. • NO: • Significantly increased in ES compared with sham ES after 12th session. • Skin temperature: • Significantly higher increase in ES than sham ES.
Conclusion • Application of low-intensity ES increases VEGF and NO expression • May lead to improved blood flow and tissue temperature and, consequently, wound healing in diabetic foot ulceration.