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Si/W Update. Mar 1, 2004 Oregon & SLAC. We have some (10) prototype detectors at UO 5 mm granularity; 757 pixels per wafer Designed for bump-bonding to a complete readout chip UO test stand is working for old detectors Test stand electronics is functionally same as SLAC design
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Si/W Update Mar 1, 2004 Oregon & SLAC • We have some (10) prototype detectors at UO • 5 mm granularity; 757 pixels per wafer • Designed for bump-bonding to a complete readout chip • UO test stand is working for old detectors • Test stand electronics is functionally same as SLAC design • Readout chip: SLAC expects a complete design for prototyping in about 1 month