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Yield, V a riability & Reliability in the Nanoera:

Yield, V a riability & Reliability in the Nanoera:. Will existing approaches survive?. Debbora Ahlgren VP Sales & Marketing OptimalTest 26-May-2009. MPU to Multi-Core SoC Trend. Homogeneous Array of Cores Fixed Function Units Global Coherency Hardware.

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Yield, V a riability & Reliability in the Nanoera:

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  1. Yield, Variability & Reliabilityin the Nanoera: Will existing approaches survive? Debbora Ahlgren VP Sales & Marketing OptimalTest 26-May-2009

  2. MPU to Multi-Core SoC Trend Homogeneous Array of Cores Fixed Function Units Global Coherency Hardware Multi-Core is more power-efficient Power ~ Area Single-Thread Performance ~ Area *.5 Source: Intel, www.intel.com

  3. Combination  Higher Value Systems . .  “More than Moore … and More for Less” More than Moore: Application-Driven Process Diversification Sensors Analog/RF Passives HV Power Biochips Actuators 130nm Interfacing & Interacting with Environment CPU 90nm 65nm Moore’s Law: Scaling 45nm Memory 32nm Digital Data Processing & Storage 22nm . Logic Source:ITRS, Intel

  4. Qualcomm vs. Intel Source: Core Logic 2008

  5. 3 Imperatives For Mobile Internet Source: XOHM

  6. Business Model Transitions Process Node (Year) 90nm (2003) 65nm (2006) 45nm (2008) 32nm (2010) 22nm (2012) Window Of Opportunity Window of Opportunity With the move to 300mm- diameter wafers, the price tag for an advanced production fab has become out of reach for all but the largest IDMs…* TI Source: Gartner, 2008 Source: Gartner, 2008

  7. Integrating the DistributedManufacturing Model Foundry Services

  8. Integrating the DistributedManufacturing Model Channel System OEMs ODMs Packaging Services End-Use Customer Service Providers Sub- System OEMs Test Houses S/W & Content Providers

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