1 / 15

D Ø Silicon Radiation Damage So Far

D Ø Silicon Radiation Damage So Far. Sergey Burdin (FNAL) for the D Ø Collaboration All Experimenters’ Meeting 8/8/2005. D Ø Silicon Detector. Fraction of disabled Silicon Modules. D Ø Silicon Detector Failure Modes. Components Failures Radiation Damage. Radiation Monitoring.

kura
Download Presentation

D Ø Silicon Radiation Damage So Far

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. DØ Silicon Radiation Damage So Far Sergey Burdin (FNAL) for the DØ Collaboration All Experimenters’ Meeting 8/8/2005

  2. DØ Silicon Detector D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  3. D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  4. Fraction of disabled Silicon Modules DØ Silicon Detector Failure Modes • Components Failures • Radiation Damage D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  5. Radiation Monitoring • Instantaneous beam losses are measured by BLMs and FINGERS • Radiation damages to the Silicon Detector are studied using • Bias Current Measurements • Depletion Voltage Measurements • Charge Collection Efficiency • Noise at n-side D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  6. Dependence of Bias Current on Delivered Luminosity Layer 3 Layer 1 Warm-up during shutdown D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  7. John Omotani Estimate of the Radiation Dose • Description of annealing processes could be tuned using this data D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  8. Dependence of Depletion Voltage from Dose Measured at Booster 7/1/05 D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  9. Depletion Voltage: Noise at n-side 0.3 fb-1 0.3 fb-1 0.5 fb-1 0.5 fb-1 • Noise at n-side in Double Sided Double Metal sensors has abnormal behavior • To be cross-checked at the test-stand Noise (ADC counts) Noise (ADC counts) beam beam beam beam Layer 1 (DSDM) Layer 4 (DS) 1.0 fb-1 1.0 fb-1 1.0 fb-1 1.0 fb-1 beam no beam beam no beam Voltage (V) Voltage (V) Sara Lager D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  10. L3 DSDM L1 DSDM L4 DS L2 DS Change in Depletion Voltage for Different Layers Sara Lager D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  11. Depletion Voltage: Charge Collection Efficiency • HV Scan with tracks Vdepletion D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  12. Comparison of different methods • Depletion voltages measured using different methods agree D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  13. Dependence of Depletion Voltage from Delivered Luminosity • There are indications that the depletion voltage for the DSDM sensors decreases with radiation dose DSDM D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  14. Prospects for Depletion Voltage • Behavior of depletion voltage for DSDM sensors agrees with the booster measurements of the DS ladders • Assuming this agreement in future • Vdepletion~ Vmax = 150V at delivered luminosity 5—7 fb-1 D0 Radiation Damage / S. Burdin (FNAL) @ AEM

  15. Summary • We study the radiation damage using several methods • DSDM sensors have abnormal noise behavior • Within assumptions made at previous slide • We should be able to deplete the DØ silicon Layer 1 up to 5—7 fb-1 • Other silicon layers should survive longer • Lower depletions limits would reduce this range D0 Radiation Damage / S. Burdin (FNAL) @ AEM

More Related