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Figure 1. 10 nm Nickel nanopillars produced via block co-polymer templating. The larger features are produced by overgrowth of a nickel film on to the surface of the block co-polymer film (Bakker et al.).

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Instrument

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  1. Figure 1. 10 nm Nickel nanopillars produced via block co-polymer templating. The larger features are produced by overgrowth of a nickel film on to the surface of the block co-polymer film (Bakker et al.). Acquisition of a Field Emission Scanning Electron MicroscopeMark Weaver, Tonya Klein, Rainer Schad, Viola Acoff, Martin BakkerThe University of Alabama Tuscaloosa, DMR Award #0321180 Instrument • We have acquired a JEOL 7000F field emission scanning electron microscope for materials science research and education. • This microscope has been equipped with standard secondary and backscattered electron detectors, a low kV backscatter detector, a scanning transmission microscopy (STEM) detector, energy and wavelength dispersive X-ray (EDX and WDX) analysis systems, an electron backscattered diffraction (EBSD) system and an attachment for electron beam lithography. • Broader Impacts and Education • This instrument has been utilized by a multidisciplinary group of researchers representing • five academic departments (chemistry, physics, metallurgical & materials engineering, chemical engineering, electrical engineering) and the NSF-sponsored Center for Materials for Information Technology at the University of Alabama. • Chris Redden, a summer REU student working with Dr. Martin G. Bakker (Chemistry) has worked extensively with this instrument during the summer of 2005. Figure 2. Multiphase microstructure of NiAlPtHf based overlay coating after annealing at 1150°C/1h (Weaver et al.).

  2. Acquisition of a Field Emission Scanning Electron MicroscopeMark Weaver, Tonya Klein, Rainer Schad, Viola Acoff, Martin BakkerThe University of Alabama Tuscaloosa, DMR Award #0321180 Motiviation • We have acquired a JEOL 7000F field emission scanning electron microscope for materials science research and education. • This microscope has been equipped with standard secondary and backscattered electron detectors, a low kV backscatter detector, a scanning transmission microscopy (STEM) detector, energy and wavelength dispersive X-ray (EDX and WDX) analysis systems, an electron backscattered diffraction (EBSD) system and an attachment for electron beam lithography. • This instrument has been utilized by a multidisciplinary group of researchers representing five academic departments at the University of Alabama.

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