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NuPECC Meeting Copenhagen , June 2012 . SPIRIT 3-Year STATUs. Wolfhard Möller. Institute of Ion Beam Physics and Materials Research Helmholtz-Zentrum Dresden- Rossendorf Dresden, Germany . European Access to Ion Technologies. www.spirit-ion.eu. Coordinated by.
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NuPECC Meeting Copenhagen, June 2012 SPIRIT 3-Year STATUs Wolfhard Möller Institute of Ion Beam Physicsand Materials Research Helmholtz-Zentrum Dresden-Rossendorf Dresden, Germany
European Access to Ion Technologies www.spirit-ion.eu Coordinatedby • 11 Partners from 6 European Member States and 2 Associated States • Free Access for European Users at9 European Ion Beam Laboratories • Development of Ion Technologies for Materials Analysis andModification • Promotingand Training Activities
The SPIRIT Consortium U Surrey KU Leuven HZDR Dresden UBW Munich CEA Caen/ Saclay UPMC Paris RBI Zagreb ETH Zurich JSI Ljubljana CNRS/U Bordeaux ITN Lisbon
SPIRIT Dates and Numbers Project Duration 1-March-2009 – 28-Febr-2013 Prolongation envisaged – 31-Aug-2013 Total EC Funding6.991.000 € Total User Time > 13.000 h Distribution of Budget Distribution ofActivities ● All activitieswell on track ● Very positive Midterm Evaluation in 2011
European Access to Ion Technologies SPIRIT offers • Ion-beam based quantitative materialsanalysisRutherford backscattering (RBS) ElasticRecoilDetection (ERD) NuclearReaction Analysis (NRA) Proton-induced X-rayemission (PIXE) …. • Ion-beam modificationofmaterialsConventionalionimplantation Plasma-basedionimplantation Ion-assistedthinfilmdeposition • Ion irradiationNuclearmaterials Biological cells ….
SPIRIT Transnational Access (TNA) • total usertime tobedelivered ~13000 hrs Origin of Users
SPIRIT Transnational Access (TNA) • total deliveryofuser time will exceedtheinitiallyprojectedoneby > 5%
SPIRIT Networking • Workshops andTutorials (internalandexternalparticipants) • Tutorial "Ion Implantation and Irradiation", Dresden, Germany, Dec 2009 • Tutorial "Ion Beam Surface Analysis", Zurich, Switzerland, June 2011 • Tutorial "High-resolution DepthProfiling", Paris, France, June 2011 • Tutorial "Live CellMicro-irradiation", Lisbon, Portugal, July 2012 • Workshop "New Detector Technologies forAdvanced Materials Research using Ion Beam Analysis", PlitviceLakes, Croatia, Oct 2010 • Workshop"High-resolution DepthProfiling", Paris, France, June 2011 • Workshop "Ion Beamsas a Tool for Nanotechnology", Lisbon, Portugal, July 2012 • Technician Exchange Program • Standards and Round Robin Actions • Ion Beam Analysis • Implantation FluenceControl • Cell Irradiation Protocols
SPIRIT Joint “Research” Activities (JRA) • Beams • Targeted Irradiation • In-situ Instrumentation • Improving Analysis • Detector Development • ReductionofAnalysing Beam Effects • Extendinginto New Fields • 3-dimensional Analysis • Chemical andMolecular Imaging
Targeted Irradiation UBW / TU Munich • Living cellirradiation • Beam exitwindow • Single iondetection • in-situ microscopy • small beam spot (~ 500 nm) • high targetingaccuracy (~ 1 μm) Irradiation of HeLa cells with 55 MeV carbon ions at. g-H2AX foci (green) indicate the position of strand breaks.
In-situ Instrumentation • Fast RBS Analysis duringAnnealing • Ruggedized PIPS detector • Fast dataacquisition KU Leuven Thermal reactionof a Ni+7%Pt thinfilmwiththe Si substrate
Dectector Development: Segmented PIPS • Large detectorarea • reduces time ofanalysis • reducesirradiationdamageof sample • deterioratesenergyresolution due tokinematicspread HZDR Dresden UPMC Paris
Detector Development: 2D position sensitive • Useof X-rayequipment • 1.5x1.5 cm2TimePixdetector • 256x256 pixel • Energyresolution (MeVα) ~60 keV • Lateral resolution ~10 μm ITN Lisbon Blockingpattern of 2 MeV 4He particlesbackscatteredfrom6H-SiC andbest fit by collisional Monte Carlo simulation
Small, high-resolution gas ionization detectors ETH Zurich RBI Zagreb • noradiationdegradation • very high heavy ionenergyresolutionMeVprotons 11 keV 72 MeVXeions 1.4 % • miniaturizedversionavailable
3D Analysis using Confocal PIXE • 2D lateral resolutionby beam scanning • depthresolution ~20 μmbyfocused X-raycollection JSI Ljubljana Tomography of a gunshot residue microparticle using confocal PIXE analysis
Chemical analysis: High-resolution PIXE wavelengthdispersiveanalysisusingcrystalspectrometer RBI Zagreb S. Fazinic et al., J. Anal. At. Spectr. 26(2011)2467
Chemical Analysis: MeV SIMS • Molecular Mapping • "Soft" electronic desorption: moreintact large molecules • Simultaneous RBS and PIXE analysis • Option ofoperationatambientpressure Univ. Surrey leucine (aminoacid)
Multi- andInterdisciplinary User Research • Materials Research Nanosystems • Biomedical R&D Tissue-materials interaction Radiation biology • Environmental InvestigationsPollution Remedy • Cultural Heritage Studies Environmental & Cultural Heritage (12%) Materials (81%) Biomedical (7%) Materials (81%)
Jet Sputtering by Electronic Energy Loss • Very high sputteringyield • Modified thermal spikedescription User Marcel Toulemonde GANIL-CIRIL Caen, France Heavy ionirradiation 200 MeV Au+ Infrastructure UBW/TU Munich Sputteredclusters on catcher Thermal componentandjetcomponent
Highlychargedioninteractionwithsurfaces 40 keV Xe25+ 1 µm x 1 µm • Pit formation • Monatomicheight • Very high sputteryield • Synergyofkineticand potential energy User W. Meissl et al. UT Vienna KBr (100) Infrastructure HZDR Dresden HZDR Dresden UT Vienna F. Aumayr et al., J. Phys. Condens. Matter23(2011)393001
Dopantdiffusion in Ge • Gepreferableto Si due to high carriermobility • Largely different material properties d-doping with B by MBE Diffusion duringannealing after ionirradiation User Elena Bruno MATIS IMM-CNR Catania, Italy Enhanced borondiffusion after oxygenionbombardment Peculiar non-Gaussiandiffusionprofiles Influenceof GeO2nanoclusterformation Infrastructure Univ. Surrey G.G. Scapellato et al., Phys. Rev. B 84(2011)024104
Stability of EUV optical multilayers • EUV reflectionopticsforspacemissions • deteriorationby solar wind Mo/Simultilayer 1 keV H+ irradiation User M.G. Pelizzo CNR-PN Padova, Italy Infrastructure HZDR Dresden SiO2/Sicapping Ir/Sicapping after before Significantloss in low-wavelengthreflectivitydepending on architecture M.G. Pelizzo et al., Optics Express 19(2011)14838
Ion Beam Analysis forForensicApplications • Wherehasthevictim / thesuspectedbeen? • Information byanalysisofsandgrains Simulatedcriminalcase Canonicaldiscriminantfunctionsfromelementaldistributions PIXE / PIGE microanalysis User S. Calusi Univ. and INFN Firenze, Italy Infrastructure Univ. Surrey K Ti Fe Cr Reliableidentificationofprovenance M.J. Bailey et al., Anal. Chem. 84(2012)2260
NiTi for prosthetic implants • Superelasticity • Shape-Memory Effects • But: BiotoxicityofNi User Rui Martins Inst. Tecnol. e NuclearLisbon, Portugal Plasma Immersion Implantation 20...40 keV N++ O+ O+ N+ Infrastructure HZDR SurfacelayerstronglydenudedofNi
Bioapplications of Nanomaterials • Magneticnanoparticlesareusedascontrastagents in magneticresonanceimaging • Interaction ofmagneticnanoparticlesandcells ? • Toxicity ? User Giacomo Ceccone EC Joint Research CentreIspra, Italy PIXE Cytosol Nucleus Infrastructure CNRS-CENBG Optical Fe C Nanoparticlesdecoratetheperinuclearregionofthecell
Phytoremediation of Agricultural Pollutants • Localizationofnutritionelementsandmetals in plants • Defencemechanismsagainstuptake User LyudmillaLyubenova Helmholtz Zentrum München, Germany μPIXE Infrastructure JSI Ljubljana L. Lyubenova et al., Metallomics4(2012)333
Photocatalytic Thin Films • TiO2 (anatase) for environmental decontamination • N dopingforactivationbyvisible light • Thinfilmdeposition: Reactive DC magnetronsputteringwith N codoping User NunoBarradasInst. Tecnol. e NuclearLisbon, Portugal HI-ERD Infrastructure HZDR Surprise: thereis Na in thefilms (fromglasssubstrate)Surprise: thereismore C than N in thefilms
Industrial Applicationsand Services • SPIRIT: onlylittleindustrialuse3 of ~190 proposalsHowever: significantindustrialservicesat SPIRIT partners (upto ~30% of total activities) • Industrial criteriaNon-disclosure: nopeerreviewing! Fast deliveryNearbypartnership(mostly) Quality control(ISO certification?) Bilateral cooperationorpurchasecontractspreferred • MultidisciplinaryApplicationsIon beam materialsanalysis Ion implantation