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8. 7. 6. 5. 4. 3. PRESENTATION START. CRIS SERIES Chip Resistor Inspection on Substrate. Key benefits Inspects wide range of packages High throughput up to 2.5 secs / substrate Mark inspection using stroke analysis
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PRESENTATION START
CRIS SERIESChip Resistor Inspection on Substrate Key benefits • Inspects wide range of packages • High throughput up to 2.5 secs / substrate • Mark inspection using stroke analysis • High accuracy measurement and comprehensive package dimensions selectable by user • Propreitary lighting design to enhance hard to see defects • Immediate quality assurance cost effectively and flexible configuration • Consolidated inspection report and comprehensive reporting format • Ease of use and fast learning curve
Vision Inspection One click to auto segment and learn the characters !! Good System detects broken 0 and extra ink on 5 !! Bad
Vision Inspection Darker defect Lighter defect Darker defect
Process Vision Inspection Pass ? Yes Inspect Print Registration Inspect Mark Quality Inspect Surface Defects Produce Report No Laser Cut Yes Any bad resistors ? Fail Bins Laser cut bad resistors No Pass Bin Cycle Time = 2.5 secs / substrate