200 likes | 416 Views
Electronics and Computer Science. Versatile High-Level Synthesis of Self-Checking Datapaths Using an On-line Testability Metric. Petros Oikonomakos Bashir M. Al-Hashimi Mark Zwolinski. Electronic Systems Design Group. University of Southampton, UK. Motivation.
E N D
Electronics and Computer Science Versatile High-Level Synthesis of Self-Checking Datapaths Using an On-line Testability Metric Petros Oikonomakos Bashir M. Al-Hashimi Mark Zwolinski Electronic Systems Design Group University of Southampton, UK
Motivation • On-line testability and Self-checking design • High reliability requirements • Hostile environments • …but significant hardware and / or performance penalties • High-level synthesis • Fast time-to-market • Fast and efficient design space exploration • Specification-driven optimisation at the highest level of abstraction High-level synthesis for on-line testability
Outline • Introduction • Physical and Algorithmic Duplication and Inversion-based Self-checking Design • High-level Synthesis Background • Implementation : Transforms, Metric, Algorithm • Synthesis and Simulation Results • Conclusion
Introduction • Self-checking design at the RTL : typical in industry • Self-checking design before high-level synthesis • Self-checking design after high-level synthesis • Our approach : self-checking design within high-level synthesis!!!
Duplication Inversion CUT CUT* CUT INV(CUT) Comparator Comparator Self-checking design • INV(CUT) : functional “inverse” of CUT • Fault secure for arithmetic modules • CUT* : functionally equivalent to CUT • Fault secure by nature
Self-checking design Physical vs. Algorithmic Duplication • Physical Duplication • physically duplicated operators • over 100% hardware overhead • Algorithmic Duplication • behaviourally duplicated operations • possible significant hardware savings
Self-checking design Physical vs. Algorithmic Inversion • Physical Inversion • no advantage over duplication • Algorithmic Inversion • allied to algorithmic duplication • possibly more hardware savings than algorithmic duplication
High-level synthesis background • behavioural HDL code • initial design iterative refinement (optimisation loop) • drivenby a cost function • based on available (scheduling, allocation) transformations • controlled by an algorithm
transformation valid? perform transform? perform another transform? High-level synthesis optimisation loop transform and data selection validity check y cost estimation n n y execution n y end
Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #2C2 #1C1 Initial state
Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #2C2 #1C1 N+1 C3#2´ N+2 != Applying an on-line test resource insertion transform
Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #2C2 #1C1 C1#2´ N+1 != Optimising for area
Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N #2C2 #1C1 N+1 C3#2´ N+2 != Applying an on-line test resource insertion transform
#1 #2´ #2 Implementation - Transforms within the Multiple Objective Optimisation in Data and control path Synthesis (MOODS) High-level Synthesis Suite N C1 C2 C3 != Optimising for speed
Implementation - Metric • Overall cost function Cost=c1α1+c2α2+...+cnαn Enhancing the cost function to includeon-line testability • αn+1=Ton-line=σ1P1+σ2P2(1-P1)+σ3[log(L-1)+σ4] P1 : % of on-line testable operations P2 : % average idle time availability L: average error latency σ1,σ2,σ3,σ4: constants
Implementation - Algorithm • Simulated annealing • Choice between duplication and inversion based on clock period requirements • Area- and / or delay-oriented heuristics …more on MOODS : reference [7]
testability % testability % testability % delay (ns) delay (ns) area (slices) area (slices) area (slices) delay (μs) tseng diffeq qrs Experimental results z z z y y y x x x • 3-dimensional design space, on-line testability on the z-axis • x-y plane : untestable designs • design space exploration
Experimental results The significance of design space exploration Optimisation Settings Results Area (slices) Max Freq. Cycles Testability Area, delay 146 48MHz 7 - Area, delay, testability 165 (+13%) 4MHz 7 Inv (100%) Delay, testability172 (+17.8%) 38MHz 7 Dupl (100%) (tseng benchmark) • optimum design depends on clock speed requirements • the tool provides options the designer makes decisions!
Experimental results Simulation • transparent fault injection and simulation, at the RTL • independent experiments, a single fault at a time • random faults, random inputs Results (Tseng benchmark)
Conclusion • Integral, cost function-driven on-line test synthesis framework • Properties and contributions: • Versatility : hardware- or time-redundancy according to designer’s requirements • Fully automatic insertion of self-checking resources • Quantification of on-line testability • Utilisation of the inversion testing idea