VLSI Testing Lecture 10: Memory Test
VLSI Testing Lecture 10: Memory Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 28, 2012, 9:00-10:00AM. Contents.
445 views • 26 slides