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Ringberg seminar AK Butt : 24.05.04 – 28.05.04

Tip characterisation. Uwe Rietzler. Ringberg seminar AK Butt : 24.05.04 – 28.05.04. The influence of tip geometry. imaging of surfaces. rapture forces. adhesion. lipid penetration. Self-Assembled Monolayers. SPIP Software. Nanoscope Software. Tipcheck sample. SiG rating TGT01 sample.

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Ringberg seminar AK Butt : 24.05.04 – 28.05.04

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  1. Tip characterisation Uwe Rietzler Ringberg seminar AK Butt : 24.05.04 – 28.05.04

  2. The influence of tip geometry imaging of surfaces rapture forces adhesion lipid penetration Self-Assembled Monolayers

  3. SPIP Software Nanoscope Software Tipcheck sample SiGratingTGT01 sample Different possibilities for tip characterisation SPM-based SEM-based

  4. TipCheck SPIP Software Method 1 TipCheck • Acquire a picture • Analyse the data • with the SPIP Software

  5. TipCheck

  6. TipCheck SPIP Software Method 1 TipCheck • Acquire a picture • Analyse the data • with the SPIP Software

  7. SPIP, the Scanning Probe Image Processorsoftware 11 11 radius 28nm x-axis radius 38nm radius 20nm y-axis

  8. Method 2 SiGrating TGT01 SiGrating TGT01 • Acquire a picture • Analyse the data • with the SPIP software • Or analyse the data • with the NanoScope • software

  9. GratingTGT01

  10. Method 2 SiGrating TGT01 SiGrating TGT01 • Take a picture • Analyse the data • with the SPIP software • Or analyse the data • with the NanoScope • software

  11. Method 2 SiGrating TGT01 • Analyse the data with the NanoScope software

  12. Method 2 SiGrating TGT01 • Analyse the data with the NanoScope software 1x1 aspect ratio

  13. Method 2 SiGrating TGT01 • Analyse the data with the NanoScope software 2 1 3 4

  14. r=31nm Method 3 SEM

  15. ± ± Radius 20-60 nm ± ± ± ± Radius 5-40 nm ± ± ± ± ± ± ± ± ± ± 1 2 3 4 Data interpretation

  16. Correlation

  17. Conclusion • Advantages of the software based methods • no additional equipment • powerful software tools • offline evaluation • Disadvantages of the software methods • change of the sample and second approach (tip crash) • take a long time ~30min • large errors

  18. Conclusion • Advantages of the SEM method • checkingquality of the whole tip (i.e. coatings) and measure radius at • the same time • each takes  5min, measuring 50 tips in one SEM session • recommended by cantilever manufacturers • Disadvantages of the SEM method • metal coatingif standard SEM is used (SiN-tips) • contaminate or damage the tip if standard SEM is used • limited tilt angle using Leo-Gemini SEM

  19. Acknowledgements Rüdiger Berger SPM and proof-reading Marco Möller SPIP and TipCheck Gunnar Glaßer SEM Rüdiger Stark NanoScope-Software Markus Wolkenhauer proof-reading Nice atmosphere and help: AK Prof. Butt and in particular to my office colleagues: Gabi, Candie and Susana ... and you for your attention

  20. SPIP, the Scanning Probe Image Processorsoftware SiGrating TGT01 TipCheck SEM value84,8nm

  21. Data interpretation

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