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T545 ： TEM analysis(1)

T545 ： TEM analysis(1). Trigger cut Spatial resolution Angle measurement Response uniformity Cluster Conclusion. Trigger cut electron. Tr1 mean±2σ Tr3 mean±2σ Mu < ped 5 σ Cere > ped 5 σ. Trigger cut pion. Tr1 mean±2σ Tr3 mean±2σ Mu mean±2σ Cere < ped 5 σ. Trigger cut muon.

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T545 ： TEM analysis(1)

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  1. T545：TEManalysis(1) • Trigger cut • Spatial resolution • Angle measurement • Response uniformity • Cluster • Conclusion GLC cal meeting

  2. Trigger cut electron • Tr1 mean±2σ • Tr3 mean±2σ • Mu < ped 5 σ • Cere > ped 5 σ GLC cal meeting

  3. Trigger cut pion • Tr1 mean±2σ • Tr3 mean±2σ • Mu mean±2σ • Cere < ped 5 σ GLC cal meeting

  4. Trigger cut muon • Tr1 mean±2σ • Tr3 mean±2σ • Mu mean±2σ • Cere < ped 5 σ • 6S.L. 1-20strip sum mean±2σ GLC cal meeting

  5. Spatial resolution • 1-4 GeV electron • 5 points Gaussian fit • 3 point Lorentzian function GLC cal meeting

  6. Compare Gaussian fit and Lorentzian function Gaussian Lorentzian GLC cal meeting

  7. Compare Gaussian fit and Lorentzian function Lorentzian Gaussian GLC cal meeting

  8. Compare T517 and T545 (gauss)spatial resolution –energy dependence T517 T545 GLC cal meeting

  9. Compare T517 and T545(gauss)angle resolution –energy dependence T517 T545 GLC cal meeting

  10. Angle measurementz correction • 4 GeV inc • Fit shower curve • Use <z> GLC cal meeting

  11. Compare T517 and T545Angle measurement T545 T517 GLC cal meeting

  12. Response Uniformity4 GeV inc 1S.L.,6S.L. 6 S.L. 1 S.L. GLC cal meeting

  13. Compare T517 and T5452 GeV inc GLC cal meeting

  14. Compare T517 and T5452 GeV electron GLC cal meeting

  15. Scint light leak check • 15,16 strip uniformity • PMT configuration GLC cal meeting

  16. Cluster separation • 4 GeV inc • Noise -> 0(MIP) P.H.< ped 4 σ • P.H.x + P.H.y GLC cal meeting

  17. >=3 Cluster event GLC cal meeting

  18. Conclusion • Spatial resolution 5.0mm /√E(2S.L.) • Angle resolution 4.5° /√E • Angle measurement y=0.92x+0.26 • Cluster<=3 event mapping GLC cal meeting

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