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Plan of IEEE NSS presentation by Aaron Mac Raighne and Diamond test beam analysis update

This presentation by Aaron Mac Raighne and Dima Maneuski provides an update on the analysis of efficiency, charge loss, and resolution for the IEEE NSS. The topics covered include charge sharing, MIPs results, energy calibration, and more.

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Plan of IEEE NSS presentation by Aaron Mac Raighne and Diamond test beam analysis update

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  1. Plan of IEEE NSS presentation by Aaron Mac Raighne and Diamond test beam analysis update Dima Maneuski on behalf of Aaron

  2. Presentation plan • Contents • Efficiency / charge loss • Charge sharing • Resolution • MIPs results from Velo test beam • Other things Dima Maneuski

  3. Efficiency / charge loss • Based on IWORiD2009 poster/paper (Eva Gimenez) planar 3D n-type Step size 2.5 um, beam size ~4x6 um Dima Maneuski

  4. Efficiency / charge loss • What’s to be done • Background subtraction • Efficiency as a function of (x, y) • For central pixel (1 x 1) • neighbouring pixels (3 x 3) • Efficiency as a function of radius (if it make sense) • For central pixel (1 x 1) • neighbouring pixels (3 x 3) • Efficiency map for different depletion voltages • Compare charge loss at saddle points to simulations (D. Pennicard) • Deconvolute the Gaussian beam shape and extract effective radius • of columns • All this for n- and p-type sensors and compare to 2D Dima Maneuski

  5. Charge sharing • What’s to be done • Eta distribution (like for strip detector) • Compare planar and 3D • Factor out charge loss in corners due to electrodes • All this for n- and p-type sensors and compare to 2D • Different depletion voltages Dima Maneuski

  6. Resolution • Resolution • Reference D. Pennicard’s work (Line spread function) • Maybe we will do MTF • MIPs results • results from Velo test beam of 3D sensor (Marco’s talk) • Other things • Energy calibration (Diamond) • Threshold equalisation using X-rays (Diamond) (hope to get better Flatfield images in comparison to planar) Dima Maneuski

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