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Modules Produced With Low R int Sensors

Modules Produced With Low R int Sensors. Anthony Affolder UCSB. Modules Produced with low R int sensors. 5 modules were produced with a set of 10 sensors with low interstrip resistances 5036 (Sensors 32016112, 32016113) Depletion Voltage 168 V 5041 (Sensors 32016111, 32016101)

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Modules Produced With Low R int Sensors

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  1. Modules Produced WithLow Rint Sensors Anthony Affolder UCSB

  2. Modules Produced with low Rint sensors • 5 modules were produced with a set of 10 sensors with low interstrip resistances • 5036 (Sensors 32016112, 32016113) • Depletion Voltage 168 V • 5041 (Sensors 32016111, 32016101) • Depletion Voltage 173 V • 5077 (Sensors 32016114, 32016103) • Depletion Voltage 150 V • 5187 (Sensors 32016120, 32016117) • Depletion Voltage 166 V • 5100 (Sensors 33600223, 33215723) • Depletion Voltage 296 V

  3. What we can(not) measure • With the ARCS system, we can measure the isolation of the strips only through noise and calibration injection • Mostly a measure of the load capacitance on the channel • We do not have the tools to measure other quantities which would be very important to the determination if these sensors are usable • Cannot measure Rint vs V to know to what severity that the sensors have this problem • Cannot measure the charge collection efficiency, charge sharing, and single hit resolution with tools at UCSB • Need a pinpoint penetrating laser/source scan

  4. Results (I) • With the previous caveats, all 5 modules look identical to other 10 modules made that day with unaffected sensors at 400 V bias voltage • For the four modules with the low depletion voltage (150-180 V), the modules showed regular noise response at the 10% level with a bias voltage as low as 20 V • In order to make a more strong statement, Rint vs. bias voltage has to be known at low bias voltages • At such low voltages in becomes difficult to distinguish between under-depletion and Rint effects

  5. Result (II) • For module 5100, a noise source on order of the same size as the other noise source can be seen on second half of module until 150 V bias applied • Since sensors have a depletion voltage of 300V, it is not possible with this measurement to know if increase noise is due to Rint effects or under-depletion • To disentangle the two effects, measurements of signal are needed • Laser/source/beam

  6. Conclusions • 5 modules using low Rint sensors for Pisa have been built • All 5 modules show regular performance in tests possible at 400 V • 4 of the modules show regular noise down to 20 V • 1 module shows increased noise up to 150 bias voltage • Not clear if it is Rint or under depletion effect • Karlsruhe has agreed to perform laser/source scans on modules 5100 and 5187 in order to address this issue and issues of charge sharing, hit resolution, etc.

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