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The Future of NVIS Display Measurement. Dr. Richard Young Optronic Laboratories, Inc. Introduction. Thanks to the excellent quality of modern scanning instruments, NVIS compatibility measurements have become almost routine. What improvements could instrument manufacturers make…. Introduction.
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The Future of NVIS Display Measurement Dr. Richard Young Optronic Laboratories, Inc.
Introduction Thanks to the excellent quality of modern scanning instruments, NVIS compatibility measurements have become almost routine. What improvements could instrument manufacturers make…
Introduction A wish-list for improvements… • Better sensitivity, so low luminance small spot sizes can be measured as easily as high luminance large spot sizes. • Less variation in results • Faster scans • Greater portability and ruggedness • Lower cost
Sensitivity and Variability Scanning systems have plenty of sensitivity Much of the variability is due to the longer wavelengths
Sensitivity and Variability The OL 770-NVS detector is based on silicon, and hence has a different shape, There is no dramatic change in longer wavelength sensitivity
The Multiplex Advantage • When all the light is “seen” all the time: • Noise is decreased. • Sensitivity is increased. • Measurements can be faster. The multiplex advantage means that an instrument simultaneously measuring a signal over a range of frequencies obtains a t1/2 advantage in the time t required to obtain a given signal-to-noise ratio compared to that which would be necessary using dispersive methods if the noise is detector-limited. http://scienceworld.wolfram.com/physics/MultiplexAdvantage.html
Spectroradiometer design • The OL 770-NVS is a special type of spectroradiometer, many decades better than other multi-channel devices. • Far higher sensitivity • Much lower noise • Orders of magnitude lower stray light • Vastly improved electronics • Dedicated software • State-of-the-art technology
MIL Spec: Others • A.3.3. Wavelength accuracy & repeatability • Accuracy typical <0.5 nm, spec. 1 nm • Repeatability typical <0.01 nm, spec. 0.5 nm • A.3.4. Current Resolution • 16 bit, spec. 12 bit. • A.3.5. Zero Drift • Typical <0.01%, spec. 0.2%
MIL Spec: Others • A.3.6. Linearity • In scale <0.5%, spec. 1% • Between scales <0.1%, spec. 2% • A.3.7. Signal Conditioning • Required controls for improving s/n provided • A.3.8. Stray light • Passes easily
MIL Spec: Others • A.3.9. Spectroradiometer Optics • Full scale at <0.1 fL, spec. 1 fL (at 0.007” spot size) • A.3.10. Spectroradiometer Viewing System • Exact, spec. <5% of spot diameter • A.3.11. Spectroradiometer Accuracy • Typically < 1%, spec. 5% • Typically u’v’ <0.0003, spec. 0.007
Other Advantages • Since there are no moving parts • the construction is rugged and compact • results are highly repeatable • time taken in moving the monochromator, changing filters etc. is avoided
Other Advantages • Since there is no photomultiplier • A very expensive component is avoided • The detector is not damaged by strong light • High voltages are not required • Since all the wavelengths are measured at the same time • It doesn’t matter if the source is d.c., a.c., modulated or flashed
An Intercomparison Study Green B NVIS Yellow NVIS Red
NVIS Green B Results For <1 second scan For 1-2 minute scan
NVIS Green B Results For 2 minute scan For <1 second scan For 1-2 minute scan
Study Conclusions • All systems gave extremely good repeatability in NRa, NRb and chromaticity. • All systems gave the same results with very low uncertainties. • All systems showed that NRa and NRb were essentially constant across a wide luminance range for each display. • All systems showed chromaticity was essentially constant with luminance for each display.
General Conclusions • Developments over the past year have made it possible to design a new type of system for NVIS display measurements. • This new type of system represents a quantum leap in performance and value. • All the wish-list items are fulfilled.