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200nm. Integrated In-Situ and Resonant Hard X-ray Studies (ISR). Group Leader : Christie Nelson Proposal Team : R. Clarke 1 , A. Fluerasu 2 , R. Headrick 3 , J. Hill 2 , J. Jordan-Sweet 4 , V. Kiryukhin 5 , K. Ludwig 6 , P. Lyman 7 , C. Nelson 2 , R. Pindak 2
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200nm Integrated In-Situ and Resonant Hard X-ray Studies (ISR) • Group Leader: Christie Nelson Proposal Team: R. Clarke1, A. Fluerasu2, • R. Headrick3, J. Hill2, J. Jordan-Sweet4, V. Kiryukhin5, K. Ludwig6, P. Lyman7, C. Nelson2, R. Pindak2 • 1Univ. of Michigan, 2Brookhaven National Laboratory, 3Univ. of Vermont, 4IBM, 5Rutgers Univ., 6Boston Univ., 7Univ. of Wisconsin TECHNIQUES AND CAPABILITIES • Two Stations using 3m undulator in high-β straight section: • - ES-A with psi 6-circle diffractometer and heavy-load diffractometer with 10+ T magnetic field • - ES-B with base diffractometer accommodating custom large environment chambers • Energy range of 2.4-23 keV for resonant studies of a very wide range of important elements • Full polarization control and analysis • KB mirrors giving 1 μm vertical focusing • Coherence-preserving optics for studies of nanoscale dynamics and complementary imaging studies in complex environments • Capable of combining a wide range of techniques for integrated materials investigations including: Polarized XRD, RXS, CTR, XRR, GISAXS, GID, XPCS, XRIM FOE ES-A ES-B Applications Example: Atomic-scale mapping of quantum dots formed by droplet epitaxy (Kumahet al. Nature Nano. 2009) Example: Multipolarorder in UPd3 (Walker et al. PRL 2006) Example: Real-Time GISAXS measuring kinetics of self-organized nanoscale structure formation on Si during Ar+ bombardment (Madi et al. PRL 2011) ISR will accommodate a wide range of chambers for studies of surface and growth processes in complex environments. In addition to enabling higher flux/higher time resolution “incoherent” surface-sensitive studies it will also give an enabling impetus to the development of surface-sensitive coherent x-ray studies of surface dynamics. ISR will provide a unique tool for studies of new materials with novel electronic and magnetic properties. The combination of such an extended energy range with full polarization control/analysis would allow definitive characterization of electronic states, including their multipolar character and the quantum-mechanical nature of the magnetic moment. • ISR will bring unprecedented brilliance to probe the structure of chemistry of functional surfaces and interfaces through CTR studies. Its wide energy tunability will also enable resonant scattering studies that can dramatically improve diffraction phasing. Moreover, the polarization control of the beamline will facilitate the study magnetic order at interfaces and surfaces. • . Specific Projects / ADDITIONAL INFORMATION • Psi 6-circle diffractometer in ES-A will enable use of small environmental chambers for in-situ experiments • ES-B will enable use of flexible range of sophisticated environment large chambers for in-situ study of materials during growth/processing • A 1 μm vertical focus of the full beam intensity (nearly 1014 photon/s with Si(111) resolution) with 1.5 m working distance from the focusing optic • Synergy with proposed NEXTGen Materials Physics and Processing (MPP) Beamline • Future build-out possibility adding canted undulator feeding one or two stations with side bounce fixed energy monochromators MPP ISR Expansion