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This study investigates the effect of low-intensity cathodal direct current on the release of plasma vascular endothelial growth factor (VEGF) and nitric oxide (NO) in diabetic foot ulceration. The results suggest that electrical stimulation increases VEGF and NO expression, which may improve blood flow and wound healing in diabetic foot ulcers.
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Effect of low-intensity direct current on expression of vascular endothelial growth factor and nitric oxide in diabetic foot ulcers Mohammad Reza Mohajeri-Tehrani, MD; Faezeh Nasiripoor, MSc; Giti Torkaman, PhD; Mehdi Hedayati, PhD; Zohreh Annabestani, MD; Mohammad Reza Asadi, MSc
Aim • Investigate effect of low-intensity cathodal direct current on release of plasma vascular endothelial growth factor (VEGF) and nitric oxide (NO) in diabetic foot ulceration. • Relevance • Diabetic foot ulceration is a significant complication of diabetes. • Evidence exists that expression of growth factors like VEGF may reduce its occurrence.
Method • Subjects: • 20 type 2 diabetic patients with foot ulceration. • 13 age-matched healthy subjects. • Treatment (random assignment): • Electrical stimulation (ES) (n = 10). • Cathodal direct current 1 h/d, 3 d/wk for 4 wk (12 sessions). • Sham ES (placebo, n = 10). • Measures: • VEGF and NO (blood samples) at 1st and 12th sessions before and after intervention. • Wound surface area and skin temperature at 1st, 6th, and 12th sessions.
Results • VEGF: • Significantly increased in ES compared with sham ES after 1st and 12th sessions. • NO: • Significantly increased in ES compared with sham ES after 12th session. • Skin temperature: • Significantly higher increase in ES than sham ES.
Conclusion • Application of low-intensity ES increases VEGF and NO expression • May lead to improved blood flow and tissue temperature and, consequently, wound healing in diabetic foot ulceration.