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Usability of Published SEE Data

Usability of Published SEE Data. Munir Shoga The Radiation Group, Inc. 8/30/07. Bibliography of Author. Graduated from Rutgers Univ and hold MS & Ph.D degs. in Elec. Engg (solid state devices) I was the SEU guy at Hughes / Boeing for ~ 20 years

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Usability of Published SEE Data

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  1. Usability of PublishedSEE Data Munir Shoga The Radiation Group, Inc. 8/30/07

  2. Bibliography of Author • Graduated from Rutgers Univ and hold MS & Ph.D degs. in Elec. Engg (solid state devices) • I was the SEU guy at Hughes / Boeing for ~ 20 years • From part to system level, I assessed all space programs at Hughes/Boeing for 18 years ( > 50 programs) • Have over 40 publications & presentations in SEE and other semiconductor devices • Tested or supported over 2000 hours of beam time SEE testing parts and, some more, doing FXR & TID testing • Holds four patents and two pending • Two Boeing awards for technical excellence

  3. Where can I find Test Data? • Own data on C:\, D:\, flash memory cards, CDs, on one of laptops / PCs, in the office or at work, or on somebody else’s PC, etc. • In various conference and none conference journals and proceedings • Various internet websites and databases

  4. Doing Your Job • You may have • To do unit analysis of some 20 parts or many units on a system • You may have to design space hardware • Planning for a SEE test • You may need to perform rate prediction • May not have sufficient budget • Program schedule does not allow a test

  5. How to get data? • Search all PC hardware • E-mail or call colleagues at work or in other companies • Search all available journals and proceedings • Search the internet (vendors and other available databases), etc. • Do own testing

  6. Can I use published data? • Bias, temperature, frequency, or operating conditions are different than the published test data • The test data is old? • Did the part process / design change? • Is there a vendor or fab location change? • Is there sufficient data?

  7. How useful is the Data? • Will the data answer my questions: • Upset (SEU) characteristics • Transient (SET) characteristics • Latchup, burnout, gate rupture, SEFI, stuck bit, etc. • Do I need to do more testing?

  8. When to use published data? • For critical applications you MUST test to your operational bias conditions, orbital conditions, and program requirements - You may use published data when writing your test plan • For Non-Critical applications you may: • Use the data • Use transient (SET) characteristics in your design • If you do not have budget to test • If schedule does not allow for a test • You may use the data but with a good engineering judgment

  9. Introducing Single Event Effects Database Software • Tow versions are available now for MS Windows: • SEE PRO 2007 for desktop • SEE NET PRO, a Client – Server (for the enterprise)

  10. SEE PRO & SEE NET PRO • Contains all published data, 1983 - 2007 • Presented in a powerful & easy to search software interface • Two versions: desktop and Client – Server for the Enterprise • Updates every 6-months

  11. SEE PRO cont’d • It contains 24 years of test data (heavy ion, proton, and neutron) • It has either a data set of cross sections vs. LET/Energy or just the LET Threshold and saturated cross section • Data collected from conference proceedings, journals, and various Internet web sites • Within minutes you can get useful part’s data

  12. SEE PRO cont’d • Enterprise access to the data • Has e-mail address of most testers and hence one can e-mail the tester for a report or row data • Any one with credentials can add data, reports, etc • Very important: for companies with many individuals conducting tests and have lots of data, this is one place for every one to save their data and reports • If some one leaves the company you know that all his test data and reports are in SEE PRO

  13. Who is it for? • For aerospace and avionic companies' survivability and design engineers • Manufacturers building units and boards for space an avionics • For consultants supporting space systems • For component manufacturers to find out their parts SEE performance and their competition’s • For researchers to investigate trends in technology, function, operational characteristics, etc.

  14. Conclusion • SEE PRO / SEE NET PRO • Reduce cost of searching SEE test data • Helps in planning new SEE testing • Helps design engineers in their part’s selection • A place to organize all your SEE test data and reports • Updates will be made every 6-months

  15. Future Database • Complete suite of radiation effects. It will contain: • TID data • Displacement damage • FXR data • Material database

  16. Contact Information Munir Shoga The Radiation Group, Inc. 30251 Golden Lantern # 413 Laguna Niguel, CA 92677 Phone: (562) 858-0942 Fax: (949) 215-1620 E-Mail: munir@SEUdata.com www.SEUdata.com

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