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This project focuses on the VLSI testing process, including the development of a compiler, logic simulator, and a parallel approach for logic simulation. The results obtained from the simulation are demonstrated on a C17 circuit.
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ELEC7250 VLSI Testing:Final Project Andrew White ELEC7250: White
Overview • Problem Description • Plan • Results • Demonstration ELEC7250: White
Plan • Compiler • Hierarchical bench formats are flattened • Logic Simulator • Used simulation table and test vectors • Two states (1,0) ELEC7250: White
Plan • Algorithm • Input vector is propogated through to the output • Traverse through the gates in levels ELEC7250: White
Results ELEC7250: White
Results ELEC7250: White
Plan • Due to long logic simulations • Parallelize the problem • Parallel Approach • Same algorithm as the sequential approach • Main node broadcasts the simulation table to all other nodes • Main node reads in test vector file and evenly distributes vectors to all other nodes • Each node computes vector values and reports the results to the main node ELEC7250: White
Results ELEC7250: White
Fault Diagnosis • Find faulty vector • Find faulty outputs • Algorithm complexity ELEC7250: White
Demonstration C17 Circuit ELEC7250: White
Conclusion Questions/Comments? ELEC7250: White