310 likes | 497 Views
Beam Instrumentations for KEK ERL Test Facility. Makoto Tobiyama KEK ERL beam instrumentation group. KEK campus. 3.5GeV e+/8GeV e- KEKB ring. 2.5GeV PF-ring. 6.5GeV PF-AR ring. 8GeV Linac. 5GeV ERL Plan. R&D Plan towards the ERL Light Source. Development of the key components
E N D
Beam Instrumentations for KEK ERL Test Facility Makoto Tobiyama KEK ERL beam instrumentation group
KEK campus 3.5GeV e+/8GeV e- KEKB ring 2.5GeV PF-ring 6.5GeV PF-AR ring 8GeV Linac
R&D Plan towards the ERL Light Source • Development of the key components • DC photocathode gun • 1.3GHz CW laser • Superconducting cavities, cryomodules and cryosystems • Beam dynamics • Beam instrumentations • ERL test facility • Testing critical components under beam operations • Generation and acceleration of ultra-low emittance / short bunch length beams • Investigation of accelerator physics issues
KEK ERL Beam Instrumentation Group • Members • T.Mitsuhashi KEK-PF • S.Hiramatsu KEKB • T.Kasuga KEK-PF • T.Obina KEK-PF • M.Tobiyama KEKB • T.Naito KEK-ATF • K.Furukawa KEK-Linac/KEKB • M.Satoh KEK-Linac • K.Haga KEK-PF • M.Tadano KEK-PF • N.Nakamura Tokyo-U ISSP • Missions: • Development of beam monitors for ERL • Development of control system including femto second timing technology
Beam instrumentation for ERL • Beam profile measurement • Fluorescence screen • Optical profile monitor by OTR or SR • Wire scanner (SEM or Compton scattering) • High speed gated camera • Beam position measurement • BPM (electric) • BPM (SR or OTR) • Intensity measurement • DCCT • Differential DCCT to measure beam loss • Photocathode, Faraday cup • SR or OTR based intensity monitor
Beam instrumentation for ERL • Emittance measurement • Fluorescence screen with slit • Wire scanner • Interferometer by SR or OTR • Beam temporal structure • Streak camera (SR or OTR) • Incoherent intensity interferometer (SR or OTR) • CSR interferometer • BLM (opto-electric) • Beam Halo • Wire scanner • Coronagraph (SR or OTR) • Beam loss monitor
Emittance monitor (screen, with slit?) Stripline type BPM Wire scanner or SEM Injection Part
BPM(accelerating beam / decelerating beam) BPM(accelerating beam / decelerating beam) OTR or F. screen OTR or F. screen SC Cavity part SC Cavity part
Differential DCCT to measure current valance (or beam loss) between accelerated beam and decelerated beam
SR3 SR4 SR5 SR2 SR1 SR6 SR7 BPM Screen、OTR Arc sections
cavity BPM Bunch length monitor (one pass, Opto-electric type) Test port for developments Long straight section
Dump line BPM Screen
Present status of development • BPM • Development of BPM electrodes (feedthrough) with better time response • Simulation work to design stripline electrodes • Bunch-by-bunch position detection using iGp • Cavity-type BPM • Design / trial manufacturing of a air-model • Differential DCCT • Under consideration.. • Fluorescence screen with slit • Trial manufacturing
Present status of development(SR related monitors) • Measurement of beam halo • Coronagraph technique have been shown to be usable down to 10-7 using PF ring. • Optical phase space monitor • Measurement of bunch length using intensity interferometry • Input optics system with all mirror-optics for femto-second streak camera
Coronagraph for halo measurement Anti-reflection disk Field lens Relay lens Baffle plate (Lyot stop) Objective lens Opaque disk Baffle plates to reduce reflection
Observation for the more out side Single bunch 65.8mA Exposure time of CCD : 3msec Intensity in here : 2.05x10-4 of peak intensity 2.55x10-6 Far tail Exposure time of CCD : 100msec Background leavel : about 6x10-7
ex=40 (nm*rad) ey=13 (nm*rad) BH31 in R56=0.1 (m) T566 = -0.11 (m) Bunch Compress: BK-BH31 sz=0.17 (mm)=0.57(psec) se=10.0 x 10-3
iGp signal processor 509MHz External Memory 8Mbyte Timing / Clock distribution Fid FPGA Vertex II XC2V6000-6 (FF1152) Feedback signal Bunch position ADC 1.5GSPS MAX108 DAC MAX588912bit600M MAX1202 8ch 12bit ADC Embedded IOC (mini-ITX) Ethernet AD8842 8ch 8bit DAC 32bit GPIO
DAC(MAX5889) FPGA(XC2V6000) ADC(MAX108) DC/DC converter USB IF(FT2232L)
High frequency trial • KEKB iGp system: work up to 560MHz • Limited by delay scatter of FPGA to DAC • A/D seems working much higher frequency • SLAC/DimTel test set • A/D to FPGA(Spartan3) works up to 1GHz • Seems not so difficult to tune FPGA to work on 1.3GHz RF frequency
Summary • Design and development of the beam instrumentation for KEK-ERL test facility has been started. • Beam position monitor • Intensity monitor / loss monitor • SR related monitor • Constructed test line for short pulse beam at PF-BT • 0.57ps bunch length / 25Hz operation • Evaluate time response of BPMs • Test new SR related monitors