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X-Ray Fluorescence Analysis (Analisa XRF)

X-Ray Fluorescence Analysis (Analisa XRF). Analisis X-ray Fluoresensi. Pendahuluan Prinsip Kerja Skema Cara Kerja Alat Preparasi Sampel Instrumen XRF Contoh spektra. Radiasi Elektromagnetik. 1014Hz - 1015Hz. 1Hz - 1kHz. 1kHz - 1014Hz. 1015Hz - 1021Hz. Extra-Low Frequency (ELF).

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X-Ray Fluorescence Analysis (Analisa XRF)

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  1. X-Ray Fluorescence Analysis (Analisa XRF)

  2. Analisis X-ray Fluoresensi • Pendahuluan • Prinsip Kerja • Skema Cara Kerja Alat • Preparasi Sampel • Instrumen XRF • Contoh spektra

  3. Radiasi Elektromagnetik 1014Hz - 1015Hz 1Hz - 1kHz 1kHz - 1014Hz 1015Hz- 1021Hz Extra-Low Frequency (ELF) Radio Microwave Infrared Visible Light X-Rays, Gamma Rays Low energy High energy

  4. Pendahuluan

  5. Fitur XRF

  6. Prinsip Kerja

  7. Peristiwa pada tabung sinar-X.

  8. Prinsip Kerja XRF Pada teknik XRF, • dienggunakan sinar-X dari tabung pembangkit sinar-X untuk mengeluarkan electron dari kulit bagian dalam untuk menghasilkan sinar-X baru dari sample yang di analisis.

  9. Prinsip Kerja XRF • Untuk setiap atom di dalam sample, intensitas dari sinar-X karakteristik tersebut sebanding dengan jumlah (konsentrasi) atom di dalam sample. • Intensitas sinar–X karakteristik dari setiap unsur, dibandingkan dengan suatu standar yang diketahui konsentrasinya, sehingga konsentrasi unsur dalam sample bisa ditentukan.

  10. S kema C ara Kerja Alat

  11. Instrumen XRF Instrumen XRF terdiridari : • Sumbercahaya • O ptik • Detektor

  12. S yarat S ampel • Serbuk • Ukuranserbuk < 4 00 mesh • Padatan • Permukaan yang dilapisiakanmeminimalisirefekpenghamburan • Sampelharusdataruntukmenghasilkananalisiskuantitatif yang optimal • Cairan • Sampelharussegarketikadianalisisdananalisisdilakukansecaracepatjikasampelmudahmenguap • Sampeltidakbolehmengandungendapan

  13. S umber C ahaya • Tabung Sinar X • End W indow • Side W indow • Radioisotop

  14. T abung sinar x • End W indow

  15. S ide W indow Be W indow Glass En v elope H V Lead Target (Ti, Ag, Rh, etc.) Electron beam Copper Anode Filament Silicone Insulation

  16. Isotope Fe-5 5 Cm-244 Cd-109 Am-241 Co-57 Energy (keV) 5.9 14.3, 18.3 22, 88 59.5 122 Elements (K-lines) Al – V Ti-Br Fe-Mo Ru-Er Ba - U Elements (L-lines) Br-I I- Pb Yb-Pu None none Radioisotop

  17. Optik Detector Source

  18. Filter Source Filter Detector X-Ray Source

  19. C ontoh S pektra

  20. C ontoh S pektra

  21. D etektor • Si(L i) • P N Diode • Silicon Drift Detectors • Proportional Counters • Scintillation Detectors

  22. S i ( L i) D etektor FET W Indow Super-Cooled Cryostat Dewar filled with LN 2 Si(Li) crystal Pre-Amplifier Cooling: LN2 or Peltier Window: Beryllium or Polymer Counts Rates: 3,000 – 50,000 cps Resolution: 120-170 eV at Mn K-alpha

  23. PIN D iode • Cooling: Thermoelectrically cooled (Peltier) • Window: Beryllium • Count Rates: 3,000 – 20,000 cps • Resolution: 170-240 eV at Mn k-alpha

  24. Silicon Drift Detector Packaging: Similar to PIN DetectorCooling: Peltier Count Rates; 10,000 – 300,000 cpsResolution: 140-180 eV at Mn K-alpha

  25. Proportional Counter Window Anode Filament Fill Gases: Neon, Argon, Xenon, Krypton Pressure: 0.5- 2 ATM Windows: Be or Polymer Sealed or Gas Flow Versions Count Rates EDX: 10,000-40,000 cps WDX: 1,000,000+ Resolution: 500-1000+ eV

  26. Scintillation Detector PMT (Photo-multiplier tube) Electronics Sodium Iodide Disk Window: Be or Al Count Rates: 10,000 to 1,000,000+ cps Resolution: >1000 eV Connector

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