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EPIC MOS Life Test Facility. The centre of the central CCD in the MOS cameras is showing damage – Andy Read et al. This damage causes low energy redistribution changes
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EPIC MOS Life Test Facility • The centre of the central CCD in the MOS cameras is showing damage – Andy Read et al. • This damage causes low energy redistribution changes • Enhanced dark current at raised temperatures has been seen in CCDs illuminated with a focussed beam at the Panter facility (EPIC EOBB and Swift XRT) • Have so far not been able to detect the low energy redistribution in these devices • Need to replicate conditions in orbit – possibly by keeping device cold over an extended period • Need to focus X-rays onto one spot for months at a time and regularly calibrate on and off spot • We are producing at Leicester a dedicated facility based on an existing test facility with X-ray source and focussing with a micro-channel plate optic • A vacuum bellows arrangement allows accurate focussing • The optic can be remotely moved out of the beam for flat field calibration