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Liquid-phase Atomic Force Microscope. D. Niu, Y. H. Chen* Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, Anhui 230026, P.R.China *E-mail: chenyh@ustc.edu.cn.
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Liquid-phase Atomic Force Microscope D. Niu, Y. H. Chen* Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, Anhui 230026, P.R.China *E-mail: chenyh@ustc.edu.cn Liquid-phase atomic force microscope (AFM) has now been a powerful tool in nanoscience and nanotechnology. Since the probe is the main sensing module, the oscillation characteristics of the probe play a critical role in the dynamic AFM. Probe dynamics in fluids is thus investigated. This work is supported by the National Natural Science Foundation of China (Grant No.50805136). Origin and elimination of the spurious peaks Experimental investigations demonstrate that the intrinsic frequency peaks of the shaker-piezo and the contact interface between the cantilever base and the shaker-piezo dominating the occurrence of the spurious peaks. By inserting an elastic vibration absorber at the contact interface, spurious peaks could be eliminated conveniently. Dynamics of the AFM probe in liquid Two different types of dynamic behavior of the probe in water investigated by 3D mode. The scaled normal stiffness and damping of the confined water film when the probe approaches the silicon substrate. Probe dynamics is the fundamental for either sensing or dynamic imaging. Three-dimensional mode experiments show that there are two general dynamic types of behavioras the probe approaches a flat substrate.Results also imply that the confined water exhibits large damping andhigh stiffness,both decay exponentially with the increase of the tip–substrateseparation.