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MGPA Specification Discussion – 9 th Jan. 03 OUTLINE 3 or 4 gain channels discussion technical background - why 3 gains could be preferred? simulation comparisons of 3 and 4 channel versions – effect of process variations implications for layout summary
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MGPA Specification Discussion – 9th Jan. 03 OUTLINE 3 or 4 gain channels discussion technical background - why 3 gains could be preferred? simulation comparisons of 3 and 4 channel versions – effect of process variations implications for layout summary possible CAL circuit (very brief): proposed circuit and simulation result CMS Ecal
Noise (http://www.hep.ph.ic.ac.uk/~dmray/pptfiles/Ecalprog2.ppt) Rpf 4 diff. O/P gain stages 4 transconductance (VI) gain stages vRpf2 CI Cpf iCFET2 s.f. RG RI vFET2 CIN 1 charge amp. stage iRG2 VCM Original design 4 channel version all diff. O/P stages identical different gains implemented by values of RG Main noise sources: Rpf, VFET, gain resistor (RG) and VI FET relative importance depends on channel gain -> value of RG for low gain ranges RG large, noise becomes unacceptably large proposed solution: keep RG small and vary diff O/P stage gain CMS Ecal
Re-distributing gains between diff O/P and RG to keep RG small 4 chan previous 4 chan now gain re-arrangement not completely trivial need to compensate pulse shape variations for different gains due to different parasitics in O/P circuit not needed when all O/P stages identical CMS Ecal
Diff O/P stage gain compensation • O/P termination defines dominant time constant • inherent high frequency bandwidth determined • by input resistance and capacitance • -> parasitic (short) time constant (few nsec) • depends on W/L ratios and drain currents • but gain also depends on W/L ratios and currents • -> different gain channels have different • parasitic time constants • can compensate by adding extra internal capacitance • works OK but process variations affect W/L ratios • (effective length varies) • => external termination capacitance needs tuning • to compensate for internal variations • can be done but leads to different termination • capacitors for different channels 2.5 pF/ns CMS Ecal
Any way to improve? -> make use of FPPA spec review (“Memo on FPPA specifications”, C.Seez (August, 2002)) -> conclusions: 1. not possible to relax 60 pC full range signal 2. three gain ranges adequate for barrel 0 – 140 instead of 0 – 50 note: highest gain required 140 – 300 50 – 200 reduced by factor ~3 300 – 1250 GeV 200 - 400 400 – 1500 3. three gain ranges also acceptable for endcap CMS Ecal
Possible improvements from going to 3 gains using FPPA spec review conclusions can re-instate equal diff O/P gains, since highest gain can be reduced 4 – chan version 3 – chan version implications channel to channel pulse shape variation dependence on process spread goes (matching guaranteed by design) no internal compensation required & no process dependent external component selection R = 200W -> slightly increased noise for lowest gain range; 28,000 -> 34,000 electrons noise performance for other 2 ranges remains < 10,000 electrons (7000 – 8000) CMS Ecal
Simulated pulse shape (4 gain channel version) Signal sizes highest gain channel: 1 pC higher: 4 pC lower: 8 pC lowest gain channel: 32 pC s = 0 Vpk results here for nominal process parameters: s = 0 ½ fullscale signals shown for each gain range use gain matching spec. to compare (Vpk-25ns)/Vpk should match to 1% highest: -0.2% higher: +0.2% lower: +0.2% lowest: -0.2% note: sigma (continuous variable +ve & –ve) selects process variation (DL,VT) from distribution specified by manufacturer. Vpk-25ns CMS Ecal
Pulse shape 4 chan. gain version, s = -1.5 highest gain pulse shape (solid line) rise time now too slow => need to tune diff O/P stage external termination components to speed up (reduce Cdiff) can be done (precision 0402 capacitors available) s = -1.5 Cdiff highest: -1.7% higher: +0.5% lower: +0.5% lowest: +0.7% Vcm CMS Ecal
process parameter variation pulse shape example (4 gain channel version) (without any external compensation) s = -1.5 s = +1.5 s = 0 highest: 1 pC higher: 4 pC lower: 8 pC lowest: 32 pC Pulse Shape Matching highest: -1.7% higher: +0.5% lower: +0.5% lowest: +0.7% highest: -0.2% higher: +0.2% lower: +0.2% lowest: -0.2% highest: +0.7% higher: -0.03% lower: -0.03% lowest: -0.6% CMS Ecal
3 gain channelversion - no external compensation necessary because diff O/P stage parasitics same for all 3 chans s = -1.5 s = +1.5 s = 0 highest: 3 pC middle: 6 pC lowest: 30 pC Pulse Shape Matching highest: -0.04% middle: -0.04% lowest: +0.08% highest: -0.3% middle: -0.2% lowest: +0.5% highest: 0% middle: 0% lowest: 0% CMS Ecal
Layout benefits of 4 -> 3 channels 4 channel 3 channel 80 pin packages CMS Ecal
Noise justification for gain of 32? barrel: 1250 GeV -> 60 pC highest gain range 32 10 fullscale signal 40 Gev (2pC) 125 GeV (6 pC) least significant bit 10 MeV 31 MeV digitisation noise (root 12) 2.9 MeV 8.9 MeV + 40 MeV electronic noise 40.1 MeV 41 MeV CMS Ecal
Summary (1) original 4 channel design worked well from pulse shape matching viewpoint different gains realised by different RG values in VI stage -> all diff O/P gains identical but low gain channel noise too high redistributing gains between RG and diff O/P stage solves noise problem pulse shapes for different gain channels matched by internal compensation but process variations give effects which can only be compensated by selecting slightly different output termination capacitors for different gain channels difficult to quantify how big a problem but likely to complicate production e.g. production testing, VFE module assembly (won’t have standard set of component values) CMS Ecal
Summary(2) benefit of 4 -> 3 channels pulse shape matches inherently (by design): no need to “tune” pulse shape to cope with process spread by selecting different O/P termination capacitance (now checked for wide range of parameter variations (np mismatch, supply voltage, temp.) layout: minimum pin count reduced – can use more power pins (will need some extra pins for CAL circuit and I2C test) power: ~ 600 mW - > ~500 mW simplistic conclusion (from electronics perspective only) 3 gain channels -> all diff O/P stages identical -> more robust design -> less risk (note: all previous talks can be found at: http://www.hep.ph.ic.ac.uk/~dmray) CMS Ecal
Possible simple CAL circuit can adjust resistor values to get 2 or 3 points per MGPA gain range requires external trigger (where from?) Off-chip On-chip CMS Ecal
CAL circuit simulation MGPA I/P 10pF DAC value e.g. 100mV Rtc:0 ->10W 10k Rtc 1nF external components Highest gain channel O/P for 1 pC input signal Can use Rtc to simulate real signal risetime CMS Ecal