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IEEE CS Test Technology Technical Council Domain: IC and Hardware Systems Test, Design-for-Test (DFT), Yield, DFY, DFM, Quality, Reliability, Variability. Adit Singh James B Davis Professor Chair TTTC 2007- 11 Electrical & Computer Engineering
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IEEE CS Test Technology Technical CouncilDomain: IC and Hardware Systems Test, Design-for-Test (DFT), Yield, DFY, DFM, Quality, Reliability, Variability Adit Singh James B Davis Professor Chair TTTC 2007- 11 Electrical & Computer Engineering Fellow IEEE’02 Auburn University IEEECS Member Since 1981
IEEE TTTC: Test Technology Technical Council • One of two Technical Councils in CS • Membership ~ 4,500 worldwide ; ~800 volunteers • Established Regional Groups with elected chairs: North America, Europe, Asia , Latin America Emerging Groups: Eastern Europe, Middle East • TTTC sponsored/technically co-sponsored ~32 technical meetings ~ 20 US ~12-15 International
IEEE TTTC: Test Technology Technical Council • 6 active test standards efforts (e.g. IEEE 1149) • Continuing Ed and Tutorial Program with TTTC Certification • IEEE Design & Test, (JETTA), Newsletter • Seeded Development of the CS TECA database system, the WELCOME conference management system & Electronic Broadcast System EBS • TTTC Office supported by TTTC funds ($60-80K) coordinates volunteer efforts
TTTC Chair 1st Vice-Chair TechnicalMeetingsGroup TechnicalActivitiesGroup Asia &PacificGroup Tutorials &Education Group Standards Group Communi-cations Group StandingCommitteeGroup 2ndVice-Chair EuropeGroup Programs IEEE 1149.1 Booth Award TechnicalMeetingReview Committee TAC # 1 Past Chair IEEE P1149.4 Database & Member. Bylaws Newinitiatives TAC # 2 SeniorPast Chair Latin AmericaGroup TM # 1 IEEE P1149.5 Electronic Broadcast History Organiza-tion ITC Gen Chair repr. TM # 2 IEEE P1450 Marketing Nomina-tion IEEE D&TEIC repr. NorthAmericaGroup IEEE P1500 MonthlyPlanner Planning Secretary TAC # 13 News-letters Finance TAC # 14 TM # n Web
TTTC Chair TTTC Vision Single Unified Professional Community For all Test Related Activities Worldwide 1st Vice-Chair TechnicalMeetingsGroup TechnicalActivitiesGroup Asia &PacificGroup Tutorials &Education Group Standards Group Communi-cations Group StandingCommitteeGroup 2ndVice-Chair EuropeGroup Programs IEEE 1149.1 Booth Award TechnicalMeetingReview Committee TAC # 1 Past Chair IEEE P1149.4 Database & Member. Bylaws Newinitiatives TAC # 2 SeniorPast Chair Latin AmericaGroup TM # 1 IEEE P1149.5 Electronic Broadcast History Organiza-tion ITC Gen Chair repr. TM # 2 IEEE P1450 Marketing Nomina-tion IEEE D&TEIC repr. NorthAmericaGroup IEEE P1500 MonthlyPlanner Planning Secretary TAC # 13 News-letters Finance TAC # 14 TM # n Web
Technical Meetings • Large: 500+ attendees • ITC: International Test Conference (50% IEEE Plila Section) • SWTW: Semiconductor Wafer Test • DATE: Design and Test Europe (20% TTTC/CS Sponsorship) • Medium: 150 ~ 300 attendees • VTS – North America • ETS – Europe • ATS – Asia • Small/Workshops: 40 -125 attendees • US/ North America (15) • Non US (10)
Technical Meetings • Large: 500+ attendees • ITC: International Test Conference (50% IEEE Plila Section) • SWTW: Semiconductor Wafer Test • DATE: Design and Test Europe (20% TTTC/CS Sponsorship) • Medium: 150 ~ 300 attendees • VTS – North America • ETS – Europe • ATS – Asia • Small/Workshops: 40 -125 attendees • US/ North America (15) • Non US (10)
IEEE TTTC: Test Technology Technical Council • 6 active test standards efforts • Continuing Ed and Tutorial Program with TTTC Certification • IEEE Design & Test, (JETTA), Newsletter • Seeded Development of the CS TECA database system, the WELCOME conference management system & Electronic Broadcast System EBS • TTTC Office supported by TTTC funds (~$60K) coordinates volunteer efforts
IEEE CS Test Technology Technical Council Questions?