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2009 IEEE BTW Update

2009 IEEE BTW Update. Fort Collins, Colorado September 16, 2009. IEEE Board Test Workshop Update. Agenda iNEMI Test TIG Update 2010 Test Projects. Introductions. Board & Systems Test TIG Chair: Rosa Reinosa (HP) Co-Chair: James Grealish (Intel). Objective & Scope. Test

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2009 IEEE BTW Update

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  1. 2009IEEE BTW Update Fort Collins, Colorado September 16, 2009

  2. IEEE Board Test Workshop Update • Agenda • iNEMI Test TIG Update • 2010 Test Projects

  3. Introductions • Board & Systems Test TIG • Chair: Rosa Reinosa (HP) • Co-Chair: James Grealish (Intel)

  4. Objective & Scope • Test • To improve the effectiveness of the test process and the quality of electronic products in a global manufacturing environment • Scope includes test technology and process improvement for boards and systems (e.g. automated inspection, electrical test, boundary scan, functional test, system test)

  5. Test TIG Projects 2010 TEST TIG Chair: Rosa Reinosa Co-Chair: JJ Grealish Board Flexure Initiative Chair: Rosa Reinosa (HP) Co-Chair: Alan McAllister (Intel) Boundary Scan (Phase II) Chair: Phil Geiger (Dell) Co-Chair: Steve Butkovitch (Cisco) BIST Chair: Zoe Conroy Co-Chair: TBD Test Economic Model (Phase II) Chair: TBD Co-Chair: TBD

  6. Summary of 2009 activities Accomplishments • Completion of iNEMI 5 Year Test Technology Roadmap to be published by iNEMI • Completed gap analysis • Identified and reviewed proposals for 2010 projects • Completed Functional Test Coverage project

  7. Board Flexure Initiative Project 2009 Update • New Spherical Bend Test Method Standard (IPC/JEDEC 9707) is being completed • Feedback from JEDEC and IPC 6-10d committees has been gathered • Proposal will go for ballot in IPC & JEDEC in Oct 2009 Phase II • Starting in 2010 • Goal: Update IPC 9702 (Monotonic Bend Test Method) and IPC 9704 (Strain Gauge Standard)

  8. Boundary Scan Project 2009 Update • Industry Survey (completed) • Survey analysis (completed) • ITC paper (To be published) • Move forward recommendations Phase II • To be determined

  9. Functional Test Coverage Project 2009 Update • Project has been completed • Webinar held on 8/12/09 (hosted by iNEMI) • Results will be made available to iNEMI participating companies • Completed in 2009

  10. BIST Project New in 2010 • Currently in project definition phase • Need more companies to join • Chair: Zoe Conroy from Cisco (zfconroy@cisco.com) • Introduced by Huawei Potential Project Steps: • Survey (current state of BIST in the industry) • BIST as an ICT alternative Investigation • Development of Related Standards • New BIST Board Level Standard Proposal • White Paper

  11. iNEMI Test Cost Model (Phase II) New in 2010 • Seeking to optimize iNEMI Test Cost Model • Currently in project definition phase • Need more companies to join • Contact: Haley Fu if interested (halfu@nemi.org) • Introduced by Huawei

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