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Solid State Physics meeting report

Solid State Physics meeting report. g943336 Chien-chung Chen 2007/03/13. outline. 磁性起源 磁性研究 MFM(Magnetic Force Microscope) 儀器架構 工作原理. 磁性起源 the origin of magnetism. orbital motion >> diamagnets spin >> paramagnets domain >> ferromagnets.

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Solid State Physics meeting report

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  1. Solid State Physicsmeeting report g943336 Chien-chung Chen 2007/03/13

  2. outline • 磁性起源 • 磁性研究 • MFM(Magnetic Force Microscope) • 儀器架構 • 工作原理

  3. 磁性起源 the origin of magnetism • orbital motion >> diamagnets • spin >> paramagnets • domain >> ferromagnets

  4. Domain wall • Bloch Wall • 磁壁中自旋旋轉方向垂直於磁化平面方向 • 出現在塊材或較厚的薄膜 • Neel Wall • 磁壁中自旋旋轉方向平行於磁化平面方向 • 出現在厚度很薄時

  5. domain size

  6. 磁性研究 • Magnetic force microscopy studies of domain walls in nickel and cobalt films C.T. Hsieh, J.Q. Liu, J.T. Lue Applied Surface Science 252 (2005) 1899–1909 • Magneto resistance due to domain wall scattering and magneto size effect of thin Ni and Co films at low temperatures Y.C. Yeha, J.T. Lueb,, T.Y. Chenc, J.H. Liuc Journal of Magnetism and Magnetic Materials 304 (2006) e134–e136 • Magnetoresistance, micromagnetism, and domain-wall scattering in epitaxial hcp Co filmsU. Ru¨diger and J. Yu PHYSICAL REVIEW B VOLUME 59, NUMBER 18

  7. 儀器架構 AFM (atomic force microscopy) Binning, Quate, Gerber, 1986 MFM (magnetic force microscopy) Martin, Wickramasinghe, 1987 • 電腦控制 • 壓電材料(PZT) • 掃描器 • 回饋電路 • 電壓訊號 • 偏移量偵測器(四象限光電二極體) • 懸臂 探針 • 二極體雷射

  8. contact mode, non-contact mode, tapping mode 導體, 非導體表面 non-contact mode 磁力影像 針尖鍍有磁性薄膜 調變技術 工作原理AFM MFM

  9. 調變技術

  10. 工作原理 磁力作用範圍 20nmsensitivity of surface magnetization magnetic force gradient is larger than Van der Waal force gradient

  11. 工作原理 • 第一次掃描為樣品表面型態 • 第二次掃描，探針和樣品為磁力交互作用所得到的為磁力影像

  12. 水平磁化 vs 垂直磁化

  13. 參考文獻 • AFM成像原理與中文簡易操作手冊 陳哲雄 林俊勳 林紋瑞 吳靖宙 • 儀器總覽 表面分析儀器 國科會精密儀器發產中心 • 科儀新知 雙月刊 144 • Introduction to Electrodynamics David J. Griffths • Magnetic force microscopy studies of domain walls in nickel and cobalt films C.T. Hsieh, J.Q. Liu, J.T. Lue

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