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Summer School Student’s Projects. Summer School Student’s Projects. Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView
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Summer School Student’s Projects • Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView • Develop an ATE for the histogram test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView • Develop an ATE for the time-domain analysis (sine fitting algorithm) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView • Develop an ATE for the dual tone test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView At level of category standardization, in 2000 the Technical Committee 10 of the IEEE Instrumentation and Measurement Society published the IEEE 1241. It provides both standard terminology for specifying the performance of ADCs and test methods for measuring it The research project “Methods and draft standards for the DYNamic characterization and testing of Analog to Digital converters” (DYNAD) was proposed and successfully financed within the 4th Framework Programme “Standard, Measurement and Testing SMT” of the European Union. The project aimed at integrating and complementing IEC Standard 60748 for the part concerning dynamic testing, by proposing a list of parameters specifying the dynamic behavior of the converter and indicating in detail the measurement conditions and the data processingalgorithms to be adopted. ELECTRONIC VERSIONS OF IEEE STD 1241 AND DYNAD WILL BE ON THE DESKTOP OF THE PC IN THE LAB
Summer School Student’s Projects • Compare numerical results obtained by using test methods reported in the IEEE Std. 1241 and DYNAD • Compare the two standards also in terms of readability, easiness of use, completeness and effectiveness how easy is to read and comprehend the standard ? how easy is to carry out the standard test methods ? should something be added or changed or deleted in the standard ?
Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. THD, SINAD, SNHR, SFDR and ENOB of the ADC of the PCI6024 DAQ board The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. Agilent 33120A Dynad IEEE std 1241 sampling coherent and not coherent coherent sampling
Develop an ATE for the histogram test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Gain, offset, INL, DNL of the ADC of the PCI6024 DAQ board The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. Agilent 33250A IEEE std 1241 Dynad histogram histogram sinewave ramp sinewave Gain and Offset, linearity errors definitions Gain and Offset, linearity errors definitions least squares fit, end-points and min-max definition Independently and terminal based
Develop an ATE for the time-domain analysis (sine fitting algorithm) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. SINAD, ENOB of the ADC of the PCI6024 DAQ board The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. Agilent 33220A Dynad IEEE std 1241 parameter parameter three and four fixed-frequency and four multiharmonic sine-wave fitting
Develop an ATE for the dual tone test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. IMD of the ADC of the PCI6024 DAQ board The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board. Tektronix AWG420 Dynad IEEE std 1241 IMD in the frequency domain IMD in the frequency and time domain coherent sampling coherent and not coherent sampling
Guidelines • Each developed ATE must be written in LabView • A sub VI for each test method must be developed • The same notation used in the two standards must be considered • A detailed report of the work done explaining the considered test methods, highlighting existing differences in the two standards and thoroughlydescribing the developed LabView code, has to be written • Presentation of the results of the Individual Case Studies