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Fault Diagnosis Using Fault Dictionaries and Probability. Adam Ray April 28, 2005. Problem Statement. Identify which fault occurred in a failing circuit Need a way to quantify inherent uncertainties Equivalent faults Truncated test sets Assumptions Single stuck-at faults
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Fault Diagnosis Using Fault Dictionaries and Probability Adam Ray April 28, 2005 Ray: ELEC7250
Problem Statement • Identify which fault occurred in a failing circuit • Need a way to quantify inherent uncertainties • Equivalent faults • Truncated test sets • Assumptions • Single stuck-at faults • Stuck-at fault is lowest replaceable unit (LRU) Ray: ELEC7250
The Likelihood Function Likelihood of fault i, time t Faults 0,…,m failed at time t-1 N(t)=total # of remaining faults Ray: ELEC7250
Diagnostic Algorithm Ray: ELEC7250
Results on 4-Bit ALU After Tests 1 & 2 After Tests 5 & 6 After All Tests Ray: ELEC7250
More Results Fault 22-1-1 found with several wrong faults Ray: ELEC7250
Add beginning likelihoods Ray: ELEC7250
Conclusions • Algorithm correctly identifies the fault • Equivalent faults are incorrectly identified • Likelihood makes results more conclusive • Algorithm can be halted at any point • New Algorithm for multiple faults Ray: ELEC7250