1 / 21

A Transverse Profile Imager for SwissFEL Rasmus Ischebeck

A Transverse Profile Imager for SwissFEL Rasmus Ischebeck. Transverse Profile Monitors. University of Illinois. Rasmus Ischebeck. 3. Profile Measurement in FELs. Rasmus Ischebeck. 4. x-y Correlations. Intrinsic correlation Explicit x-y dependency introduced by RF deflector.

sanaa
Download Presentation

A Transverse Profile Imager for SwissFEL Rasmus Ischebeck

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. A Transverse Profile Imager for SwissFELRasmus Ischebeck

  2. Transverse Profile Monitors University of Illinois Rasmus Ischebeck 3

  3. Profile Measurement in FELs Rasmus Ischebeck 4

  4. x-y Correlations • Intrinsic correlation • Explicit x-y dependency introduced by RF deflector Rasmus Ischebeck 7

  5. 2-Dimensional Profile Monitors • Optical transition radiation (OTR) • Scintillation Rasmus Ischebeck 8

  6. Imaging Scintillators Rasmus Ischebeck 9

  7. Electron Beam Profile MonitorsScintillators, OTR Screens & Wire Scanners • Installed scintillators • Ce:YAG • 5 µm • 20 µm • 200 µm • Ce:LuAG • 200 µm F. Piffaretti Rasmus Ischebeck

  8. Electron Beam Profile MonitorsVisual Light Optics • OTR screen / scintillator is at an angle of 45º to the optical axis • For overview camera (1:5.3 demagnification) • Use Scheimpflug criterion to correct image plane orientation • For 1:1 imaging • Perspective control lens is not available commercially • Only central part (~1…2 mm) of the screen can be imaged within depth of field Rasmus Ischebeck

  9. Scheimpflug Snell Screen Monitor • Theodor Scheimpflug (1865—1911) • Willebrord Snellius (1580—1626) Rasmus Ischebeck 12

  10. Imaging Scintillating Crystals Rasmus Ischebeck 13

  11. Imaging Scintillating Crystals Rasmus Ischebeck 14

  12. Imaging Scintillating Crystals Rasmus Ischebeck 15

  13. Imaging Scintillating Crystals Rasmus Ischebeck 16

  14. Trigonometry… Rasmus Ischebeck 17

  15. Observed Beam Size Rasmus Ischebeck 18

  16. Ideal Observation Angle Rasmus Ischebeck 19

  17. Screen Monitor Rasmus Ischebeck 23

  18. Measurements with the Prototype > Emittance Measurement The smallest beam in this measurement is 50 µm rms. Beams of 10 µm rms have been measured. Rasmus Ischebeck 25

  19. Measurements with the Prototype • Slice emittance measurement of a 10 pC beam Eduard Prat, Marta Divall Rasmus Ischebeck 26

  20. Measurements with the Prototype • Slice emittance measurement of a 1.3 pC beam Eduard Prat, Marta Divall Rasmus Ischebeck 27

  21. Thank You to… • Hansueli for the technical design • The AMI team for manufacturing the components • Markus for the assembly • Markus, Albert & the Vacuum group for installation • Eduard the emittance measurement software, and for using the new profile monitor extensively for emittance measurements • Gian Luca, Marta, Simona, Carlo, Thomas & Eduard for the measurements presented in this talk • Vincent for the slide on the Schwarzschild imaging • Andrea for support with patenting the design, and with connections to industry • Helge for camera server software, and Babak for synchronized data acquisition • The entire Commissioning and Operations crew Rasmus Ischebeck 37

More Related