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Presenter Information: Wallace Scott Military & Space Products, Texas Instruments

Heavy Ion Induced Single Event Effects on a 32-Bit, Floating-Point Digital Signal Processor. W.Scott , R.Joshi, R.Daniels, T.Linnebur, I.Khan, K.Settle (Texas Instruments), Dr. M.Shoga (Science Applications International Corporation - SAIC), Dr. M.Gauthier (ICS Radiation Technologies, Inc.).

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Presenter Information: Wallace Scott Military & Space Products, Texas Instruments

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  1. Heavy Ion Induced Single Event Effects on a 32-Bit, Floating-Point Digital Signal Processor W.Scott, R.Joshi, R.Daniels, T.Linnebur, I.Khan, K.Settle (Texas Instruments), Dr. M.Shoga (Science Applications International Corporation - SAIC), Dr. M.Gauthier (ICS Radiation Technologies, Inc.) Presenter Information: Wallace Scott Military & Space Products, Texas Instruments 6412 Highway 75 South, MS 860 Sherman, Texas 75090, USA Phone (903)-868-6448 Fax (903)-868-6245 w-scott@ti.com

  2. Abstract The Single Event Effects (SEE) response of SMV320C6701, a 32-bit, floating-point digital signal processor (DSP) from Texas Instruments was tested with heavy ions. The processor was tested for Single Event Latch-up (SEL) and Single Event Upsets (SEU) at room and high temperature. An innovative test methodology and test flow developed for evaluating the SEU response of different functional blocks of the DSP are discussed. The SEU response of various functional blocks of the DSP at different (Linear Energy Transfer) LETs is also presented. Finally, based on the SEE response of the DSP, its potential use in different spacecraft orbits is described.

  3. Test Device - SMV320C6701GLPW14 • Advanced VelociTITM very-long-instruction-word (VLIW) architecture • Up to 1120 MIPS and 840 MFLOPS at 140 MHz • 1 Mbit On-Chip SRAM for fast program/data access • 2 Multi-Channel Buffered Serial Ports (McBSPs) provide glueless connect to codecs & framers, full duplex operation, and support SPI and ST-Bus • -55°C to 125°C Tcase • 429-pin CBGA package 32 Program Memory 64 KByte DMA Controller EMIF 16 Host Port Interface C6701 CPU McBSP 0 McBSP 1 Timer 0 Data Memory 64 KByte Timer 1

  4. Test Device – Key Parameters

  5. Test Details Test Location:Texas A&M University Cyclotron Facility (TAMU-CF), College Station, Texas, USA Website:http://cycltron.tamu.edu Test Date:May 18, 2004

  6. SEE Test System • Monitoring and Recording equipment • Texas Instruments 256-pin Automatic Test Equipment (ATE) • Monitor Supply currents (I/Os, Core, and PLL) • Automatic power-down when supply currents exceed user programmed limits • Event-Driven, exhaustive Functional and SCAN testing • Translates to ~5-10 MHz test frequency • High-Speed (167 MHz) memory testing via internal-BIST (Built-In Self-Test) • Log parameters and fail counts

  7. SEE Test Flow • Functional • Data word sizes, DMA, EMIF • Multi-Channel Serial Ports • Power-down Mode • PLL • Continuity • Open Pins • Open Supply • Short Pins • Short Supply • Functional • ATPG (JTAG) • Memory - BIST • Functional • Boot Loading • Cache • Functional • Data and Program Memory

  8. SEE Test Flow SEU Detection SEL Detection • Continuity • Supply Shorts Continuity NO SEL • Functional Verification • Monitor Supply Currents

  9. SEU/SEFI Rate Estimation • The environment models in CREME96 were used • Solar min & Solar Max for background rates • October 1989 Large Solar Flare for worst 5-minute, worst day, worst week event rates • A shielding of 150 mils was assumed • All heavy ion rates are for GEO orbit

  10. EMIF, McBSP, DMA, Power Down Logic, Data Access Controller, Program/Cache Memory, Data Memory, Boot ModesTests: 81 Vectors:~1.3 MillionUpset Rate: 4.0E-03 upsets/day or ~250 days/upset SEU Characteristics

  11. Program/Cache and Data Memory Program Access/Cache Controller and Data Access ControllerTests: 25 Vectors:~97kUpset Rate: 2.88E-04 upsets/day or ~3472 days/upset SEU Characteristics

  12. Program/Cache Memory verification using BIST (167 MHz)Upset Rate: 3.47E-05 upsets/day or ~28837 days/upset SEU Characteristics

  13. Data Memory verification using BIST (167 MHz)Upset Rate: 1.75E-04 upsets/day or ~5709 days/upset SEU Characteristics

  14. SEU Characteristics CPUTests: 49 Vectors:~32 MillionUpset Rate: 6.24E-04 upsets/day or ~1603 days/upset

  15. Summary and Conclusion • SMV3206701 is not susceptible to SEL up to tested LET of 89 MeV-cm2/mg and max temperature of 125°C • The DSP has an estimated worst-case SEU rate of 4.0E-03 upsets/device-day or ~250 days per upset (GEO orbit) • The DSP did not show significantsensitivity to different bias voltages and temperatures

  16. Summary and Conclusion (Cont.) • The total gamma dose hardness level is 100 krad(Si) • SMV3206701 is suitable for Space and for all spacecraft orbits (GEO, LEO, etc.) • Proton upset rate estimation applicable for LEO orbits is underway

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