Design For Testability Supplied By Vayoinfo
Design For Testability (DFT) is an expert in the SOC design cycle, which facilitates a design for detecting production defects. With the increase in size & complexity of chips, assisted by the progression of manufacturing technical advancement, It has evolved as a expertise in itself over a period of time. DFT Engineers, works on presenting various test components as part of the design flow, to improve the testability of logic, pads, memories, interconnects. For design for testability contact to vayoinfo @ http://www.vayoinfo.com/design-for-testability/
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