'75x10 mm sapphire sphere' presentation slideshows

Investigation on annealing effect in a Suprasil sample and loss measurements in silicon samples

Investigation on annealing effect in a Suprasil sample and loss measurements in silicon samples. Elisabetta Cesarini a,b) , Gianpietro Cagnoli a,c) , Enrico Campagna a,d) , Matteo Lorenzini a,b) , Giovanni Losurdo a) , Filippo Martelli a,d) ,

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