'Cadence encounter test' presentation slideshows

Techniques for Test Power Reduction in Leading Edge IP Using Cadence Encounter Test -ATPG:

Techniques for Test Power Reduction in Leading Edge IP Using Cadence Encounter Test -ATPG:. By Praveen Venkataramani. Objective. To reduce dynamic power during test in scan based designs To obtain test vector sequences with minimum switching and pattern count without any loss in test coverage.

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