'Dfx consideration' presentation slideshows

Design for Testability is not a new concept – Vayoinfo

Design for Testability (DFT) is not a new concept. It has been used with electronic appliance design for over 50 years. The reason there is simple: if you want to be able to test an built-in circuit both during the design stage and later in development, you have to design it so that it can be tested. Contact for design for testability, @ http://www.vayoinfo.com/design-for-testability/

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