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ELEC 7770 Advanced VLSI Design Spring 2014 Introduction

ELEC 7770 Advanced VLSI Design Spring 2014 Introduction. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr14. Related Course: VLSI Design.

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ELEC 7770 Advanced VLSI Design Spring 2014 Introduction

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  1. ELEC 7770Advanced VLSI DesignSpring 2014Introduction Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr14 ELEC 7770: Advanced VLSI Design (Agrawal)

  2. Related Course: VLSI Design • ELEC 5770/6770: Review of MOS transistor fundamentals, CMOS logic circuits; VLSI fabrication and design rules; clocking strategies and sequential design; performance estimation; memories and programmable arrays; standard cell design methodologies; computer aided design (CAD) tools. ELEC 7770: Advanced VLSI Design (Agrawal)

  3. Related Course: Computer-Aided Design of Digital Circuits • ELEC 5250/6250: Hardware components of multiprocessor systems including processor, interconnection, memory, and control architectures; Software elements of parallel processing including inter-processor communication, task partitioning, task mapping and scheduling, load balancing, programming languages, and parallel algorithms. ELEC 7770: Advanced VLSI Design (Agrawal)

  4. Related Course: Low-Power Design of Electronic Circuits • ELEC 5270/6270: Design of digital circuits and systems for reduced power consumption, power analysis algorithms, low-power MOS technologies, low-power design architectures for FPGA, memory and microprocessor, reduction of power in testing of circuits. ELEC 7770: Advanced VLSI Design (Agrawal)

  5. Related Course: VLSI Testing • ELEC 7250: Introduction to VLSI testing, test process and automatic test equipment, test economics and product quality, fault modeling, logic and fault simulation, testability measures, combinational and sequential circuit test generation, memory test, analog test, delay test, IDDQ test, design for testability, built-in self-test, boundary scan, analog test bus, system test and core test. ELEC 7770: Advanced VLSI Design (Agrawal)

  6. Related Course: Digital System Design • ELEC 4200: Hierarchical, modular design of digital systems; computer-aided digital system modeling, simulation, analysis, and synthesis; design implementation with programmable logic devices and field programmable gate arrays. ELEC 7770: Advanced VLSI Design (Agrawal)

  7. This Course: Advanced VLSI Design • ELEC 7770: Review of CMOS logic circuits; impact of fabrication issues on design; high speed switching circuits; high performance memory structures; advanced clocking strategies and clock distribution; performance optimization; deep submicron design issues; ASIC design flow: logic synthesis, placement and routing; design verification; low power design. ELEC 7770: Advanced VLSI Design (Agrawal)

  8. Course Objectives and Evaluation • Objectives: • Learn and participate in the process of modern VLSI design, verification, and test of a chip. • Develop an understanding for the advanced design concepts in modern VLSI technologies. • Evaluation: • Project 35% • Homeworks 30% • Final exam, Apr 30, 2014, B306, 4-6:30PM 35% ELEC 7770: Advanced VLSI Design (Agrawal)

  9. Course Outline • Design Project • Advanced Topics • Economics of VLSI systems • Logic synthesis and technology mapping • Retiming and timing optimization • Soft errors and fault tolerance • Signal integrity • Verification • RF testing, alternate test, defect level, optimization • Technologies of the future (reading assignments) ELEC 7770: Advanced VLSI Design (Agrawal)

  10. Reference Books • J. M. Rabaey, A. Chandrakasan, and B. Nikolić, Digital Integrated Circuits, A Design Perspective, Second Edition, Prentice-Hall, 2003. • M. J. S. Smith, Application-Specific Integrated Circuits, Addison-Wesley, 1997. • N. H. E. Weste and D. Harris, CMOS VLSI Design, A Circuits and Systems Perspective, Third Edition, Addison-Wesley, 2005. • W. Wolf, Modern VLSI Design, System-on-Chip Design, Third Edition, Prentice-Hall, 2002. ELEC 7770: Advanced VLSI Design (Agrawal)

  11. VLSI Realization Process Customer’s need Design Determine requirements Write specifications Design synthesis and Verification Test development Fabrication Manufacturing test Manufacture Chips to customer ELEC 7770: Advanced VLSI Design (Agrawal)

  12. Defining Terms • Design synthesis: Given an I/O function, develop a procedure to manufacture a device using known materials and processes. • Verification: Predictive analysis to ensure that the synthesized design, when manufactured, will perform the given I/O function. • Test: • Characterization: A test that debugs test program by fault diagnosis. • Manufacturing test: A step that ensures that the physical device, manufactured from the synthesized design, has no manufacturing defect. ELEC 7770: Advanced VLSI Design (Agrawal)

  13. VLSI Design & Test Seminar Series • Must attend • Every Wednesday, Broun 235, 4PM ELEC 7770: Advanced VLSI Design (Agrawal)

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