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Explore the fascinating world of plasmons in carbon nanotubes through electron energy loss spectroscopy (EELS) and gain valuable insights from the latest research findings. Understand the unique behavior of plasmon peaks and electron collective resonances in nanotubes, as well as the dispersive nature of transitions. Discover the importance of STEM/EELS measurements and the future prospects of near-field microscopy and optics. Ideal for optical researchers, engineers, and curious graduates interested in cutting-edge optical phenomena.
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Electron-energy loss spectroscopy in carbon nanotubes: low energy Kamarás Katalin MTA SZFKI Thanks to: Thomas Pichler, Dresden SZFKI-MFA Carbon Nanotube Learning Seminar
Plasmons Plasmons are longitudinal oscillations of an electron gas which can not be excited by the electric field of light at normal incidence They occur whenever and can be detected by the loss of energy of an electron beam (EELS) EELS measures the loss function: KK analysis e1, e2 Results of the Dresden group are measured in transmission on extremely thin (~100 nm) samples T. Pichler, M.Knupfer, M.S. Golden, J. Fink, A.G. Rinzler, R.E. Smalley: Phys. Rev. Lett. 80, 4729 (1998) SZFKI-MFA Carbon Nanotube Learning Seminar
Optical and energy-loss spectra and transitions TO LO electron collective resonance The peak in EELS (the loss function ) occurs at higher energy than the maximum in optical absorption X. Liu, T. Pichler, M. Knupfer, M.S. Golden, J. Fink, H. Kataura, Y. Achiba: Phys. Rev. B66, 045411 (2002) SZFKI-MFA Carbon Nanotube Learning Seminar
VIS-UV spectra of nanotubes - “plasmon peaks” X. Liu, T. Pichler, M. Knupfer, M.S. Golden, J. Fink, H. Kataura, Y. Achiba: Phys. Rev. B66, 045411 (2002) SZFKI-MFA Carbon Nanotube Learning Seminar
Dispersion in EELS of nanotubes and transitions show much broader dispersion than transitions between van Hove singularities Polarization (TO, predicted): dispersive peaks: parallel to tube axis molecular peaks: perpendicular to tubes We know now that this is not right due to the antenna effect! T. Pichler, M.Knupfer, M.S. Golden, J.Fink, A.G. Rinzler, R.E. Smalley: Phys. Rev. Lett.80, 4729 (1998) SZFKI-MFA Carbon Nanotube Learning Seminar
STEM (scanning transmission electron microscope) /EELS measurements on individual samples Spectra could be taken of bundles and individual tubes, in penetrating mode (bulk plasmons) and “aloof mode” (surface plasmons) B.W. Reed, M. Sarikaya: PRB 64, 195404 (2001) SZFKI-MFA Carbon Nanotube Learning Seminar
What next? NEAR-FIELD MICROSCOPY AND NEAR-FIELD OPTICS by Daniel Courjon (Université de Franche-Comté, France) Contents: History of Near-field Optics Non-radiating Sources and Non-propagating Fields Evanescent Optics Theories and Modellings Inverse Problem and Apparatus Function Criteria of Quality, Noise and Artifacts Nano-collectors and Nano-emitters Instrumentation Main Near-field Microscope Configurations Near-field Image Processing Applications of Near-field Microscopy Appendix A: Basis of Optics Readership: Optical researchers and engineers, as well as graduates keen on peculiar optical phenomena. 340pp Pub. date: Mar 2003 SZFKI-MFA Carbon Nanotube Learning Seminar