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Mass Measurement at BESIII. X.H.MO. Workshop on Future PRC-U.S. Cooperation in High Energy Physics Beijing, China, Jun 11-18. Content Introduction Statistical optimization of mass measurement Systematic uncertainty study Summary. Introduction. Pseudomass method ARGUS CLEO
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Mass Measurement at BESIII X.H.MO Workshop on Future PRC-U.S. Cooperation in High Energy Physics Beijing, China, Jun 11-18 Mo Xiaohu
Content • Introduction • Statistical optimization of mass measurement • Systematic uncertainty study • Summary Mo Xiaohu
Introduction Mo Xiaohu
Pseudomass method • ARGUS • CLEO • OPAL • Belle • KEDR • Threshold scan • BES Points : 12 , Lum. : 5 pb1 Mo Xiaohu
B BES:PRD53(1995)20 r.c. obs Ecm (GeV) F(x): E.A.Kuraev,V.S.Fadin , Sov.J.Nucl.Phys. 41(1985)466; (s): F.A. Berends et al. , Nucl. Phys. B57 (1973)381. Mo Xiaohu
Ecm (GeV) BES results: the stat. (0.18 0.21 ) is compatible with the syst. (0.25 0.17) M =1776.96 0.18 0.25 M / M=1.7 10 – 4 0.21 0.17 Mo Xiaohu
Statistical optimization Neglecting all experiment uncertainties Luminosity L; Efficiency =14%; Branching fraction: Bf =0.1763 • 0.1784 ; [ Bf = B • B e, PDG04] Background BG=0 . Using Voloshin’s formula for obs [M.B.Voloshin, PLB556(2003)153.] Mo Xiaohu
Statistical optimization for high accurate M measurement • Assume : M is known . • To find : • What’s the optimal distribution of data taking point; • How many points are needed in scan experiment; • How much luminosity is required for certain precision. Mo Xiaohu
Evenly divided : 1, for E: E0 + E, E=(Ef–E0)/n 2, for lum. : L =Ltot /n= 3pb –1 To eliminate stat. fluctuation, Sampling many times (say, 500) Mo Xiaohu
Ecm (3.545,3.595) GeV Ltot= 30 pb –1 Npt : 3 20 | m| • Sm>> m , using Sm as criterion; • Npt =5. Mo Xiaohu
Random sampling 100 times: Ecm (3.545,3.595) GeV Ltot=45 pb –1 Npt =5; (Ecm) min. Sm =0.147MeV max. Sm=1.48MeV • Points near threshold lead to small Sm ; • This corresponds to larger derivative of d/dEcm The largest derivative point may be the optimal data taking point Mo Xiaohu
L=5 pb –1 for each point (Ecm) I Scheme I: 2 points at region I+Npt(1—20) at region II Scheme II: Only Npt(1—20) at region II d/dEcm II Only the points within region I are useful for optimal data taking point Scheme II Scheme I Mo Xiaohu
I Ecm (3.553,3.555) GeV Ltot=45 pb –1 Npt = 1—6; With the region I, one point is enough! Where should this one point locate? Mo Xiaohu
Ecm (3.551,3.595) GeV Ltot=45 pb –1 Npt = 1; scan Ecm = 3553.81 MeV Sm = 0.09559 MeV Ecm = 3554.84 MeV max d/dEcm 3553.8 MeV 3554.8 MeV Mo Xiaohu
One point With lum. Ltot Mo Xiaohu
Systematic Uncertainty Study Mo Xiaohu
Study of systematic uncertainty • Theoretical accuracy • Energy spread E • Energy scale • Luminosity • Efficiency • Background analysis Mo Xiaohu
BES:PRD53(1995)20 Accuracy Effect of Theoretical Formula Energy spread, variation form s=(Ecm)2 Energy scale, variation form Mo Xiaohu
Ecm = 3554 MeV Ltot=45 pb –1 m = 1776.99 MeV Accuracy Effect of Theoretical Formula old [BES, PRD53(1995)20] fit results: m = 1777.028 MeV , m = 0.105 MeV new [M.B.Voloshin, PLB556(2003)153] fit results: m = 1777.031 MeV , m = 0.094 MeV m = | m (new) – m (old) | < 3 10 – 3MeV Uncertainty due to accuracy of cross section at level of 3 10 – 3 MeV Mo Xiaohu
J/ Cross section (nb) J/ (1.06MeV) f(E) ; f(E)=a E+b E2+c E3 a=1; b=0; c=0; a=0; b=1; c=0; a=0; b=0; c=1; a=1; b=1; c=1; ' (1.51MeV) m < 1.5 10 – 3MeV 3 m < 6 10 – 3MeV Ecm (GeV) Mo Xiaohu
W=E+ (E=M+ ); ~ 10– 4 J/ Cross section (nb) EJ/ f(E) ; f(E)=a E+b E2+c E3 a=1; b=0; c=0; a=0; b=1; c=0; a=0; b=0; c=1; a=1; b=1; c=1; ' E m < 8 10 – 3MeV Ecm (GeV) Mo Xiaohu
BES:PRD53(1995)20 Luminosity L: 2% m < 1.4 10 – 2MeV Efficiency : 2% m < 1.4 10 – 2MeV Branching fraction: Bf : 0.5% m < 3.5 10 – 3MeV [ Bf = B • B e, PDG04] Background BG: 10% m < 1.7 10 – 3MeV [ BG = 0.024 pb –1: PLR68(1992)3021 ] Total :m < 2.02 10 – 2MeV Mo Xiaohu
Summary:systematic Mo Xiaohu
Absolute calibration of energy scale BESI: E=0.2MeV Fix, stable, regular, eliminate and controllable UNSTABLE and IRREGULAR, uncontrollable KEDR Collab. , depolarization method: Single energy scale at level of 0.8 keV, or 10 –4 MeV Total systematic error at level of 9 keV, or 10 – 3 MeV Bottleneck Mo Xiaohu
Event selection Data taking design Optimal point BKG. study >100 pb –1 , 50 pb –1 , >100 pb –1 Mo Xiaohu
Summary • Statistical and systematic uncertainties have been studied based on BESI performance experience. • Monte Carlo simulation and sampling technique are adopted to obtain optimal data taking point for high accurate mass measurement. We found: • optimal position is located at large derivative of cross section near threshold; • one point is enough, and 45 pb–1 is sufficient for accuracy up to 0.1 MeV. • Many factors have been taken into account to estimate possible systematic uncertainties, the total relative error is at the level of 1.3 10 – 5. However the absolute calibration of energy scale may be a key issue for further improvement of accuracy of mass. Thanks! Mo Xiaohu
Backup Mo Xiaohu
Evenly divided : 1,for E: E0 + E, E=(Ef–E0)/n 2, for lum. : L =Ltot /n= 3pb –1 M=1777.0367 MeV Sm =0.4273 MeV To eliminate stat. fluctuation, Sampling many times (say, 500) The point below threshold Have no effect for fit results Mo Xiaohu
Summary:statistical • What’s the distribution of data taking point ; • How many points are needed in scan experiment ; • How much luminosity is required for certain precision. Optimization study shows that: • optimal position is locate at large derivation of cross section near threshold ; • one point is enough , • and 45 pb–1 is sufficient for accuracy up to 0.1 MeV . Mo Xiaohu
NRQCD, NNLO, accuracy better that 0.1% P.Ruiz-Femenia and A.Pich, PRD64(2001)053001. Improved the previous calculation, accuracy close to 0.1% M.B.Voloshin, PLB556(2003)153. h(v) Fc(v)10–3 v S(v)/ 10–3 h(v) Mo Xiaohu
Ecm = 3554 MeV Ltot=45 pb –1 m = 1776.99 MeV Accuracy Effect of Theoretical Formula old fit results: m = 1777.028 MeV m = 0.105 MeV new fit results: m = 1777.031 MeV m = 0.094 MeV m = | m (new) – m (old) | < 3 10 – 3MeV • ± 10 – 4 • m < 10 – 4MeV • ± 2 10 – 4 m < 10 – 4MeV Uncertainty due to accuracy of cross section at level of 3 10 – 3 MeV Mo Xiaohu