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Systematic Studies for K ± ± 0 . Silvia Goy L ó pez, Mauro Raggi 29 th June 2006. Last meeting:Table for suggested systematics 0<T<80 MeV. Central value for 0<T<80 MeV, Emin=5GeV, after L1 eff correction:. DE=(3.30 ± 0.34stat)% INT= ( -2.37 ± 0.79stat)%. TO DO.
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Systematic Studies for K±±0 Silvia Goy López, Mauro Raggi 29th June 2006
Last meeting:Table for suggested systematics 0<T<80 MeV Central value for 0<T<80 MeV, Emin=5GeV, after L1 eff correction: DE=(3.30 ± 0.34stat)% INT= (-2.37 ± 0.79stat)%
TO DO • Could it be that some ‘systematic’ effects could be due to statistical fluctuations? • Suggested by Mauro’s studies on MC and SS0 for Emin • Silvia must check on SS0 • Are we ‘forgetting’ any possible source of systematic errors?
DONE • Silvia checks on SS0 for Emin and other effects • New effects checked: • High T* cut, related to L2 efficiency • Resolution/ misstagging effects • Computation of uncorrelated errors
Results 3 PAR fit SS123 Emin> 5GeV, 0.2<W<0.9, after trigger correction. Previous meeting New 0<T<80 MeV 0<T<80 MeV Silvia was not using Mauro’s trigger correction. Mauro was using ‘old’ fitting routine. AverDE=3.35, Aver INT= 2.67, Diff DE= 0.02, Diff INT=0.19
Results High correlation between INT and DE ~-93%
Emin from last meeting Reference point 5 GeV, after teff correction For syst take full difference between 5 GeV and 7 GeV, disagreement within uncorrelated errors Frac DE Eg min (GeV) Frac INT Eg min (GeV)
Frac DE Eg min (GeV) Frac INT Eg min (GeV) Emin: No Syst • When looking at SS0 no effect found. Corroborates Mauro’s results. SS0 SS0 SS123
Emin: No Syst SS123 All points within first two ellipses: Prob ellipse 1: 0.393 Prob ellipse 2: 0.865
Frac DE Frac DE EOVP EOVP Frac INT Frac INT EOVP EOVP Eovp: No Syst SS123 SS0
Frac DE Sigmas Kaon Mass Frac INT Sigmas Kaon Mass Kaon mass: No Syst SS123 SS0
Cog: No Syst SS123 SS0 Frac DE Cog (cm) Frac INT Cog (cm)
Frac DE Delta zvn-zvc (cm) Frac INT Delta z: No Syst SS123 SS0 Delta zvn-zvc (cm)
Misstag: Last meeting Reference point at 400 cm Take for systematic evaluation point at 750 cm Frac DE zvc-zvnsec (cm) Frac INT zvc-zvnsec (cm)
Misstag: SS0 If I was using same method of calculating the effect in SS0 I would get comparable results wrt SS123 SS0 Frac DE zvc-zvnsec (cm) Frac INT zvc-zvnsec (cm)
Misstag: No Syst SS123 All points within first ellipse! Prob ellipse 1: 0.393 Prob ellipse 2: 0.865
Ppi: No syst SS123 SS0 Frac DE Ppi (GeV) Frac INT Ppi (GeV)
T* upper cut: L2 efficiency MBOX cut in mfake at 475 MeV equivalent to a cut on T*<90 MeV Resolution effects can show near the cut Try varying upper cut on T* to check effect Big effect changing from 80 MeV to 75 MeV Diff DE=0.33 Diff INT=1.03 Effect is much reduced going from 75 MeV to 70 MeV, as expected if due to edge effect of trigger cut Proposal: assign half of the difference as systematic uncertainty
Results for fractions wrt IB • Averaging Mauro’s and Silvia’s result and setting a systematic error due to difference • For 0<T*<80 MeV • Frac DE=(3.35±0.35stat ±0.18syst)% • Frac INT=(-2.67±0.81stat ±0.55syst)%
Results with 2 PAR fit • Useful in order to compare with other experiments • Much smaller systematic errors • Results have been shown on 19/05/06
Systematics 2 PAR fit: Emin No dependency on Emin seen when fitting to 2 PAR 55<T<80 MeV 0<T<80 MeV Teff corr Raw Teff corr Raw Frac DE Frac DE Eg min (GeV) Eg min (GeV)
Systematics 2 PAR fit: Kaon mass No dependency for 55<T<80 MeV. For T<80 MeV tail of 3pin coming in 55<T<80 MeV 0<T<80 MeV Frac DE Frac DE Number sigmas Number of sigmas
Systematics 2 PAR fit: Misstag No dependency from abs(zvc-zvnsec) > 400 cm 55<T<80 MeV 0<T<80 MeV Frac DE Frac DE Zvc-zvnsec (cm) Zvc-zvnsec (cm)
Systematics 2 PAR fit: Pp 55<T<80 MeV 0<T<80 MeV Frac DE Frac DE P (GeV) P (GeV)
Results 2 PAR fit Emin> 5GeV, 0.2<W<0.9 55<T<80 MeV 0<T<80 MeV NEW!!! • Good agreement found between Mauro-Silvia • Also good agreement between values in 55<T<80 MeV and extrapolation from 0<T<80 MeV
T* upper cut: L2 efficiency Big effect changing from 80 MeV to 75 MeV Diff DE=0.08 Proposal: assign half of the difference as systematic uncertainty
Results Frac DE wrt IB for INT=0 • Averaging results for 0<T*<80 MeV Frac DE(INT=0)=(2.29±0.13stat±0.04syst)% • Extrapolating to 55<T<90 MeV • Frac DE(INT=0)=(0.85±0.048stat±0.015syst)%