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SWCNT RSI Characterization Measurement Report

This measurement report from NT-MDT America Inc. provides a characterization of SWCNT RSI through topography, stiffness, and current images obtained using the NTEGRA Prima AFM instrument.

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SWCNT RSI Characterization Measurement Report

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  1. Measurement Report RSI SRI SWCNT February 2013 NT-MDT America Inc 3200 Scott Blvd. Santa Clara, CA 95054 Phone: 408-988-8409

  2. Experimental Condition • Instrument • SPM device: NTEGRA Prima • Environment • Active anti-vibration table TS-150. • Measurement Mode • AFM (scanning-by-tip, capacitance sensors): • RSI • RSI Spreading resistance • Probes • NSG 01/Pt by NT-MDT • Sample evaluated • SWCNT

  3. RSI Characterization RSI Topography Image.

  4. RSI Characterization Stiffness Current Topography RSI Topography (left). Corresponding Stiffness (center) and Current (right) Images.

  5. RSI Characterization. Topography and Current Overlay Topography Current Topography and Current Overlay RSI Topography (top left) and Current (top right) Images. Overlay of Current Image over the Topography Image (bottom). * Topography Z range is 7 nm, Current Z range is 120 pA.

  6. RSI Characterization. Stiffness and Current Overlay Stiffness Current Stiffness and Current Overlay RSI Stiffness (top left) and Current (top right) Images. Overlay of Current Image over the Stiffness Image (bottom).

  7. RSI Characterization. Stiffness and Current Overlay Stiffness Current Stiffness and Current Overlay RSI Stiffness (top left) and Current (top right) Images. Overlay of Current Image over the Stiffness Image (bottom). * Different palette used.

  8. Thank you!

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