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Photon isolation efficiency study. Zhijun Liang University of Oxford. Introduction. Motivation : Estimate photon isolation efficiency from electron sample from Z->ee Isolation defintion: Leakage correction Ambiant energy correction Selection cut :
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Photon isolation efficiency study Zhijun Liang University of Oxford
Introduction • Motivation : • Estimate photon isolation efficiency from electron sample from Z->ee • Isolation defintion: • Leakage correction • Ambiant energy correction • Selection cut : • Period D~H, EF_e20_medium, Egamma stream • Two opp charge , tight electron , pT>25GeV , eta cut • 85Gev<M(ee)<95Gev • Systematic : • In-time pileup uncertainty • Out-of-time pileup uncertainty • pT dependence • Discrepancy between electron isolation shape and photon isolation shape
In-time pileup uncertainty(1fb-1 data) Etcone30_corr[GeV] Etcone40_corr[GeV] npV<3 3<=npV<=4 5<=npV<=6 Npv>=7 Etcone20_corr[GeV]
Photon isolation efficiency in different NPV bins(1fb-1 data) Etcone30_corr[GeV] Etcone40_corr[GeV] npV<3 3<=npV<=4 5<=npV<=6 Npv>=7 Etcone20_corr[GeV]
Out of time pileup effect(1fb-1 data) (bunch position dependence) Etcone30_corr[GeV] Etcone40_corr[GeV] Bunch position <=3 4<=Bunch position <=6 7<=Bunch position <=9 Bunch position >9 Etcone20_corr[GeV]
Out of time pileup effect(1fb-1 data) (bunch position dependence) Etcone30_corr[GeV] Etcone40_corr[GeV] Bunch position <=3 4<=Bunch position <=6 7<=Bunch position <=9 Bunch position >9 Etcone20_corr[GeV]
pT dependence effect(1fb-1 data) Etcone30_corr[GeV] Etcone40_corr[GeV] Pt<35GeV 35GeV<=pT<=40GeV 40GeV<=pT <=45GeV pT>45GeV Etcone20_corr[GeV]
pT dependence effect(1fb-1 data) Etcone30_corr[GeV] Etcone40_corr[GeV] Pt<35GeV 35GeV<=pT<=40GeV 40GeV<=pT <=45GeV pT>45GeV Etcone20_corr[GeV]
Discrepancy between electron and photon Etcone30_corr[GeV] Etcone40_corr[GeV] Unconverted photon from Z->ee+gamma Converted photon from Z->ee+gamma Electron isolation from Z->ee Etcone20_corr[GeV]
Summary • Working progress report . • Plan for Final result and systematic: • In-time pileup uncertainty • Out-of-time pileup uncertainty • pT dependence • Discrepancy between electron isolation shape and photon isolation shape