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Cu 2 O. C. ZnO. Antibonding orbital. Atomic orbitals. B onding orbital. Antibonding energy level. . B onding energy level. kristall bindning. N st Si atoms. Filled; 2N Unfilled; 4N. Filled; 2N. Filled; 2N + 6N. Filled; 2N electons. N st Si atoms. Filled; 2N Unfilled; 4N.
E N D
Cu2O C ZnO
Antibonding orbital Atomic orbitals Bonding orbital Antibondingenergylevel Bondingenergylevel kristall bindning
N st Si atoms Filled; 2N Unfilled; 4N Filled; 2N Filled; 2N + 6N Filled; 2N electons
N st Si atoms Filled; 2N Unfilled; 4N Filled; 2N Filled; 2N + 6N Filled; 2N electons
Eks: GaAs Eks: Si (a) Direct (b) Indirect
Intrinsisk Si Par av e- og hull (h+) (EHP) !
Ekstrinsisk Si EC EC Ed Ed N-type (a) EV EV T = 0 K T = 50 K EC EC P-type (b) Ea Ea Ea EV EV T = 0 K T = 50 K (c)
Fermifordelning i intrinsisk, n-type og p-type material n p n = p n >p (a) Intrinsic (b) n-type n <p (c) p-type
Schematic band diagram Density of states Fermi-Dirac distribution Carrier concentration EF (a) Intrinsic EF (b) n-type EF (c) p-type
Variation in carrier mobility (cm2/Vs) as a function of total doping concentration, Na+ Nd(cm-3), for Si, Ge and GaAs at 300 K (a) Figure 3.23 (b) (c)
N st Si atoms Filled; 2N Unfilled; 4N Filled; 2N Filled; 2N + 6N Filled; 2N electons
N st Si atoms Filled; 2N Unfilled; 4N Filled; 2N Filled; 2N + 6N Filled; 2N electons
Eks: GaAs Eks: Si (a) Direct (b) Indirect
Intrinsisk Si Par av e- og hull (h+) (EHP) !