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A Novice’s View of E-Beam Lithography. Jan M. Yarrison-Rice Physics Dept. Miami University/University of Cincinnati. Raith 150 User Meeting Stanford University September 29 & 30, 2003. w/ Sebastian Mackowski & Scott Masturzo -- UC. Brief History of Raith 150 at University Of Cincinnati.
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A Novice’s View of E-Beam Lithography Jan M. Yarrison-RicePhysics Dept.Miami University/University of Cincinnati Raith 150 User Meeting Stanford University September 29 & 30, 2003 w/ Sebastian Mackowski & Scott Masturzo -- UC
Brief History of Raith 150 at University Of Cincinnati • NSF MRI Grant funded August 2002 • Instrument installed July 2003 • Initial training sessions July 7-11 • Small groups (2-3) begin design & exposure July to present 2 micron squares exposed on silicon w/ 100 nm PMMA
Research Interests • Surface Enhanced Microscopies, e.g. SERS • Pickup Coils for Magnetic Field Sensing • Electrochemical Sensing • Photonic Bandgap (PBG) Structures Exposure Schedule for Dimers
50 to 200 nm feature sizes Inter-feature spacing as small as 50 nm Pattern on ITO glass, silicon, or silicon nitride/dioxide Lithographic Requirements
Prepared Silicon Wafer Exposed Resist a) b) PMMA Silicon Dioxide Silicon Developed Resist Etched Silicon Dioxide c) d) Evaporated Metal Completed Co-planar Electrodes e) f) Exposure and Processing
Surface Enhanced Microscopies • Dimers – sharp edged doublets • Ag or Au - on glass for optical access • Size determined by plasmon frequency of nonlinear system Challenges.. • Sharp corners • Closely spaced nanoparticles 100 nm square dimers separated by 50 nm
Pick-Up Coils • Contact Pads (~200 mm) • Coil lines (300 - 400 nm) • Challenges: • Sharp corners • Proximity effect of multiple lines • Overlap of write-fields Pick-up coil from a Distance
Electro-Chemical Sensors • Interdigitated Arrays • Long 100 to 500 nm thick fingers w/ ~50 nm separation • Large contact Pads separated by mm • Au or Ag on glass Top: 500 nm digits, Bottom: 200 nm digits
Interdigitated Array #1 • 200 nm digits • Separation 200 nm • 495 PMMA A12 on Silicon ~100 nm thick Challenges - • Strong proximity effect • Write field overlap • Very different sized structures combined
Interdigitated Array #2 • 150 nm digits • Separated by 400 nm • ITO on Glass • 495 PMMA A12 to 100 nm thick
Oxide cover layer (75nm) 260 nm 450 nm Nitride core (250 nm) 225 nm Oxide buffer (1.8 mm) x 260 nm Substrate y PBG Structures • 2D arrays of etched pores • Particular Structures of Interest include: • De-multiplexer • Polarization Switching • Microcavity for Sensing
2D Triangular arrays of 150 nm etched holes Pitch ~ 250 nm Silicon nitride/silicon dioxide planar waveguide substrate Challenges - Large field patterning – write field overlap & registration Two-step etching process PBG Structure Requirements
Lithography Challenge • Best practices to make small, closely spaced features • Design of structure • Dosage choices • Aperture choice • Resist • What we have tried to date • Dosage schedules within feature for proximity • Lines around area features to sharpen edges • Dots and their use to sharpen corners
EVERYTHING else!! - from making contacts, to metallic coatings, to liftoff All advice is welcome! Other Challenges..