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Digital Background Calibration of Capacitor-Mismatch Errors in Pipelined ADCs. Mohammad Taherzadeh-Sani and Anas A. Hamoui IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS, VOL. 53, NO. 9, SEPTEMBER 2006 Page(s):966-970 指導教授:易昶霈 學 生:吳柏翰 學 號: 97662002. Outline.
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Digital Background Calibration of Capacitor-Mismatch Errors in Pipelined ADCs Mohammad Taherzadeh-Sani and Anas A. Hamoui IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS, VOL. 53, NO. 9, SEPTEMBER 2006 Page(s):966-970 指導教授:易昶霈 學 生:吳柏翰 學 號:97662002
Outline • Introduction • Digital Calibration Technique • Simulation Results • Appendix
Introduction (1/3) • The linearity of a pipelined analog-to-digital converter (ADC) is primarily degraded by the linearity errors in its pipeline stages. • The gain errors in the residue amplifier, due to the finite gain and dynamic effects of its operational amplifier. • The nonlinearity in the digital-to-analog subconverter (sub-DAC), due to capacitor-mismatch errors.
Introduction (3/3) • The proposed technique randomly swaps the feedback capacitor with the sampling capacitor(s) in the multiplying DAC (MDAC) of each pipeline stage. • Both the measurement and calibration of the capacitor-mismatch errors in each pipeline stage are then performed entirely digitally, using simple logic circuits.
Digital Calibration Technique (1/6) • Digital Calibration of 1-bit Pipeline Stages :
Digital Calibration Technique (4/6) • Effect of gain error on capacitor-mismatch calibration:
Digital Calibration Technique (5/6) • Fully differential MDAC:
Digital Calibration Technique (6/6) • Digital Calibration of Multibit Pipeline Stages :
Simulation Results (1/2) • SNDR : signal-to-noise-and-distortion ratio. • SFDR : spurious-free dynamic range.