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AXRO, DECEMBER 2009

X-ray Optics: Wolter versus KB system. Veronika Marsikova a , Libor Sveda b , Adolf Inneman a , Jiri Marsik a , Rene Hudec c , Ladislav Pina b a) Rigaku Innovative Technologies Europe, s.r.o. b) Czech Technical University in Prague, FNSPE

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AXRO, DECEMBER 2009

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  1. X-ray Optics:Wolter versus KB system Veronika Marsikovaa, Libor Sveda b, Adolf Inneman a, Jiri Marsik a, Rene Hudecc, Ladislav Pinab a) Rigaku Innovative Technologies Europe, s.r.o. b) Czech Technical University in Prague, FNSPE c) Astronomical Institute of Academy of Sciences of Czech Republic AXRO, DECEMBER 2009 1

  2. Motivation • Manufacturing Wolter system needs very expensive mandrels (3D aspheric). • Manufacturing KB system can be easier and cheaper (2D aspheric). • Substrates can be glass and/or silicon with excellent flatness and micro-roughness which is necessary for long focus optics. AXRO, DECEMBER 2009 2

  3. Wolter system • Double reflection X-ray Optics - Wolter type I optics consists of rotationally symmetric mirrors which are parabolic mirror followed by a hyperbolic mirror. • Set of nested mirrors is arranged concentrically to the optical axis. Each ray coming is reflected at the parabolic surface first, then at the hyperbolic surface. • The quality of the focal spot image of the X-ray source depends on quality of substrates (shape, microroughness). • Optical error is rectified (astigmatic and coma error). • Replicated technology requires very expensive mandrel. XMM http://imagine.gsfc.nasa.gov AXRO, DECEMBER 2009 3

  4. horizontal focusing mirror vertical focusing mirror KirckPatrick Baez system • Double reflection X-ray Optics consists of two mirror sets – one is aligned vertically and the second is aligned horizontally. • Both mirrors have to be curved parabolically – the first mirror focuses in vertical plane and the second mirror focuses in horizontal plane. Single focal point is formed in the crossection of the two focal planes. • The quality of the focal spot image depend on quality of substrates (shape, microroughness). • Technology is not necessarily based on precise and expensive mandrel. • Classic technologies for laboratory KB-mirrors are expensive, complicated and based on heavy optics. http://www.x-ray-optics.de http://imagine.gsfc.nasa.gov/ AXRO, DECEMBER 2009 4

  5. Design and simulation AXRO, DECEMBER 2009 5

  6. KB W Type of optics Parabolic-parabolic planar Parabolic-hyperbolic rotational Number of reflections 2 2 Focal length - Aperture 20 m – 913 x 913 mm 40 m – 1826 x 1826 mm 10 m – dia 913 mm 20 m – dia 1826 mm First mirror 134 mm from axis 268 mm from axis 134 mm from axis 268 mm from axis Number of mirrors 420 840 394 788 Length of substrate 300 mm 300 mm Material substrate silicon glass Surface gold gold Comparison AXRO, DECEMBER 2009 6

  7. Focal length W system L KB system 2L If W and KB have the same aperture, focal length of KB system is twice as large as Wolter system. AXRO, DECEMBER 2009 7

  8. Input conditions • Minimum distance between mirrors: 1 mm • Energy range: 1.0 – 10.0 keV • Last mirror reflection: 70% reflection (after 1st reflection @ 1keV)‏ 50% reflection (after 2nd reflection @ 1keV)‏ AXRO, DECEMBER 2009 8

  9. Aperture optics system KB system W system AXRO, DECEMBER 2009 9

  10. Reflectivity at first mirror set(Focal length 10m KB and 20m W)‏ W system KB system AXRO, DECEMBER 2009 10

  11. Source spectrum • Crab Nebula Toor & Seward (1974) Images of Crab Nebula from Chandra X-ray Observatory. Physics News Graphics, AIP. http://chandra.harvard.edu/photo/0052/index.html AXRO, DECEMBER 2009 11

  12. Off-axis source images(Focal length 10m KB and 20m W)‏ KB system W system AXRO, DECEMBER 2009 12

  13. Off-axis source images(Focal length 20m KB and 40m W)‏ KB system W system AXRO, DECEMBER 2009 13

  14. Focal peak intensity – not normalized AXRO, DECEMBER 2009 14

  15. Focal peak intensity - normalized AXRO, DECEMBER 2009 15

  16. Focal FWHM [mm] – not normalized AXRO, DECEMBER 2009 16

  17. Focal FWHM [arcsec]–normalized AXRO, DECEMBER 2009 17

  18. Focal length optimization • “ideal” focal length for both sets results in asymmetric peak • focal length of mirror set one was optimized • Differenceideal-optimal ~ 4 mm AXRO, DECEMBER 2009 18

  19. Next year enhancements • Reflectivity efficiency maps. • Segment based KB design as a result of efficiency maps (flower-like KB)‏. • Comparison to standard designs. AXRO, DECEMBER 2009 19

  20. Flower – like KB AXRO, DECEMBER 2009 20

  21. Manufacturing AXRO, DECEMBER 2009 21

  22. RITE technologies • Based on industrial substrates (glass and or Si wafer) with very good surface quality (shape, microroughness) => low cost. • Technology process retains surface quality and polishing process is not needed. • Technology allows composite materials and/or relatively light-weight materials. • Cubic geometry means easer assembling of the system. AXRO, DECEMBER 2009 22 Gorenstein, Paul,Proc. SPIE Vol. 3444, p. 382-392

  23. MFO technology X-ray optics Substrates Glass Silicon Nickel Type of optics KB system Lobster Eye ISRO Meeting Prague, October 2009 23

  24. Si substrates BEFORE AFTER

  25. Si substrates Comparison of convex side of bent Si wafers (left) and flat Si wafer (right) Analysis of formed Si wafer by TH profilometer. Analysis of formed Si wafer by AFM. AXRO, DECEMBER 2009 25

  26. RITE modules • Model based on ray-tracing (11 profiles)‏ • Two sets of mirrors from Si chips 100x100x0.525 mm • Total optics length 600 mm, aperture 40x40 mm AXRO, DECEMBER 2009 26

  27. Tests AXRO, DECEMBER 2009 27

  28. Conclusion • KB vs. W • Comparable effective area at f=2*f • KB has more homogeneous intensity • KB has comparable angular resolution • KB samples manufactured from multiple small Si chips (substrates) • Tests are expected at the beginning of 2010 • Future enhancements of KB (simulation + manufacturing – silicon and glass substrates) AXRO, DECEMBER 2009 28

  29. Acknowledgment • We acknowledge support of: • Grant Ministry of Education, Youth and Sports, grant “Applications of Kirkpatrick Baez Imaging Systems in Space”, No. ME09004. • Grant ESA - PECS, grant “Novel X-ray Optics Technologies for ESA X-ray Astrophysics Missions”, No. 98039. • Grant Agency of Academy of Sciences of the Czech Republic, grant “Material and X-Ray Optical Properties of Formed Silicon Monocrystals”, No. IAAX01220701. • Project MSMT INGO “Vyzkum v ramci Mezinarodniho centra husteho magnetizovaneho plasmatu”. AXRO, DECEMBER 2009 29

  30. THANK YOU FOR YOUR ATTENTION. AXRO, DECEMBER 2009 30

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